“Application of Time-Of -Flight Diffraction (TOFD) for Weld Inspections” Michael Moles
Presentation Outline History What is TOFD? Advantages of TOFD Limitations of TOFD Typical images Defect depth measurement Codes Some TOFD examples Summary
History Developed in UKAEA Harwell in ~70’s Manufactured commercial Zipscan Used very effectively in nuclear PISC II and DDT trials => Showed good detection and excellent sizing Recently “adopted” by petrochemical and other industries
DDT Defect Sizing using Ultrasonics
Comparison of measured vs. actual defect sizes: left, all UT techniques; right, TOFD only. (DDT Plate 1)
What is TOFD?
Time-Of-Flight Diffraction (TOFD) relies on the diffraction of ultrasonic energies from 'corners' and 'ends' of internal structures (primarily defects) in a component being tested.
TOFD: Typical Setup
Transmitter
Receiver Lateral wave Upper tip Lower tip
Back-wall reflection
TOFD Waves
The Lateral wave: A sub-near-surface longitudinal wave generated from the wide beam of the transducer.
The Backwall reflection: A longitudinal wave reflected from the back wall
The Reflected wave: A longitudinal wave reflected by a lamellar planar defect
The Tip Diffracted wave: A circular longitudinal (or L-wave) diffracted by the edge of a defect.
Advantages of TOFD
Good midwall defect detection. Accurate sizing of defects using the time of arrivals of diffracted signals. Defect detection even if defects are mis-oriented or located away from the weld centreline. Very rapid linear scanning (raster scanning not required) Non-amplitude scanning and detection. Set-up independent of weld configuration.
Limitations of TOFD
Dead zone at top surface (OD).
Dead zone at bottom surface (ID).
Sensitive to very small defects with a risk of false calls if not combined with pulse echo.
Analysis can be difficult; specialist interpretation required.
Some sizing errors possible from lateral position of defect.
Low signal-to-noise ratio.
Alternative Diffraction Arrangements Shear-shear diffraction Longitudinal-shear diffraction Single transducer diffraction (called “back diffraction” or the “tip echo method” in Japan) Twin transducer TOFD with both transducers on the same side of the defect/weld. Complex inspections, e.g. nozzles.
Typical TOFD Display •Gray scale and rf for phase info. •OD and ID visible •Defects detectable in middle •L-wave display only (usually)
Defect Depth S
S Receiver
Transmitter
t0
t0
d
Signals NOT linear; either correct, or remember
2
c 2 2 d = • (t − 2t 0 ) − S 2
Defect Analysis with Cursors A-scan d1 h
d1 t1
t2
Cursors Build-in calculator l t1,t2 ⇒ d1, d2 and h are automatically calculated
P D-scan
Use cursors on top and bottom of defect (note phase changes) Use calculator or math for analysis.
TOFD Codes Two European “guidelines”: BS7706 and EN583_6. ASTM E-2373-04 now available ASME working on TOFD codes – due out soon ASME TOFD Interpretation Manual (Nonmandatory App. N) due out very soon. ASME CC 2235 permits TOFD
Examples – Inside Surface-breaking Defect 1
Transmitter
Lateral wave
Receiver
2 3
Back wall echo blocked LW
Tip
No back wall echo
No, or reduced, backwall echo Signal from tip for detection and sizing
Example – Near-Surface Breaking Defect
Transmitter
Lateral wave is blocked
Receiver 1 2
Back-wall reflection B W No Lateral wave
Crack tip
Lateral wave blocked Sizing by measuring crack tip
Example – Midwall Defect No break in lateral wave or backwall Top and bottom signals visible (if defect deep enough) Can measure lengths using hyperbolic signals
1 2 3 4
Typical Defect for TOFD
TOFD is very “strong” on midwall defects where pulse echo is weak Strengths of TOFD complement PE, and
vice versa
Example – Lack of Root Penetration
1
•Sometimes see break in backwall signal; should see perturbation
2 3
•Defect can be sized using timeof-arrival •Similar to other root defects
Example – Lack of Sidewall Fusion
1 2 3 4
•Should see no perturbations in lateral wave or backwall •In this case, top signal is “buried” in lateral (OD) wave •Can size if signals clear.
Example - Porosity
1
2
3
Multiple small reflectors, each with hyperbolic tails. Usually can characterize, but sizing difficult.
Example – Transverse Cracks
1 2
3
Transverse cracks are rare, and similar to porosity No perturbation of lateral or backwall
Example – Interpass Lack of Fusion
Lateral wave
Transmitter
Receiver
Reflected signal Back wall reflection B W
L W Reflection echo
1 2
3
Strong signal, but defect benign. Cannot size depth.
TOFD – What can go wrong? TOFD scans can go wrong, just like any NDE inspection. Some reasons:
– Incorrect gain levels (too high or too low) – Incorrect gate positions – Incorrect transducer separation – Poor coupling – Noise interference
TOFD Equipment
New portable system reduces TOFD cost significantly
Needs encoded data e.g. handscanner or automated system
TOFD Advantages
Excellent PoD for mid-wall defects
Good detection of mis-oriented defects
Can characterize surface-breaking defects
Excellent sizing for defects in transverse TOFD mode, especially with signal processing
Tolerable sizing for defects in linear mode
Works very well in conjunction with pulse-echo
Rapid (and relatively low cost) inspections
TOFD Limitations Dead zone of ~3mm at outer surface Potential dead zone at inner surface Prone to “noise” Over emphasizes some benign defects, e.g. porosity, laminations, interlamellar LoF Hard to interpret
Finally we have a TOFD code!
A Few Final Words on TOFD
Good for detection, especially midwall
Much the best defect sizing technique available when correctly set-up
Always use in conjunction with pulse-echo for code and PoD reasons
Well worth including in inspections, even with “company specs”.
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