Mobile Phone Repairing Testing Methods

Mobile Phone Repairing Testing Methods Faults in each part, component or section of a mobile cell phone  can be repaired fast by using following 2 methods at the time of repairing mobile cell phone. These methods can also be used to nd out faulty or damaged parts or components inside a mobile cell phone . 1. Cold Testing Method: When we check the alue of resistanceusing a multimeter  at the time of repairing a fault in any mobile phone, it is called cold testing. There is no need to gie any power supply to the faulty mobile phone from any e!uipment such as "# $ower %upply or battery during cold testing. Diode &ange and 'eep %ound from the multimeter is used to nd fault in a mobile cell phone using the cold testing method of mobile phone repairing. (n this testing method, the &)" $robe of the multimeter is connected to the ground of the mobile phone $#' and the '*+# $robe is touched at the testing points of the mobile phone. "uring the fault nding and repairing process of each part, component or section, followin g correct alues will be receied: 1. Ear Phone Connector Tip (+ , -) : .- to ./ 2. oud !pea"er # Ringer Connector Tip (+,-) : .0 to . 0. $atter% Connector Tip (+) : . to .- . $atter% Connector Tip (!ense) : aboe .3 -. Displa% Connector !uppl% Pins : .2- to . . Displa% Connector !ignal Pins : .- to .3 /. Camera Connector !uppl% Pins : .2- to . 3. Camera Connector !ignal Pins : . to .4 4. &e% Tip (Ro' and Column) : . to .3 1. Charger Connector Tip : . to ./ 11. ibrator Motor Connector : . to .- 12. Po'er * #  !'itch Point (+) : . to .4 10. MC Connector Tip (nalog MC) (+,-) : ./ to .4 1. $atter% Charging ut Point (+,-) : .0 to .

1-. !M Card Connector Pin . (!im): .- to ./ 1. !M Card Connector Pin /,0,1 : . to .3 1/. !M Card Connector Pin 2 (3*D) : . 5'eep6 13. Micro !D Card Connector Pin 2 : .- to . 14. Micro Card Connector Pin 1 (3*D) : . 5'eep6 2. Micro Card Connector Pin .,/,0,4,5,6: . to .3 21. RTC: . to .- 22. Data R7 and T7 Pins : . to ./

1. 8ot Testing: This is the second method of fault nding and repairing any mobile cell phone. 7ot testing method of mobile phone repairing is adopted when the fault cannot be found or when the phone cannot be repaired using the #old Testing 8ethod. (n this method, 9*T+;) of damaged part, component or section of a mobile phone is checked.  The fault is found by giing $ower %upply t o the mobile phone with a 'attery of "# $ower %upply )!uipment such as "# $ower %upply. (n this method, "#9 5"# 9olt6 range of the 8ultimeter is selected. The '*+# $robe of the multimeter is connected with the ;round of the 8obile $hone $#' and the &)" $robe is touched at the Testing $oints. "uring 7ot  Testing method, 9oltage of di