Introduction to GR228X Test Systems

NT Version

Introduction to GR228X Test Systems 9007-4008-03

Printed in U.S.A.

IEC417

Symbol ! on equipment signifies that the manual contains information to prevent injury or equipment damage. Refer to page vi and to other manuals in set.

Copyright  GenRad, Inc. 1999. All rights reserved under copyright laws of the United States and other countries. The technical data included herein, excluding computer software documentation, is subject to the LIMITED RIGHTS as set forth in FAR 52.227-15 (JUN 1987) and DFARS 252.227-7015 (JUN 1995). All technical data and computer software documentation contained herein is proprietary and confidential to GenRad, Inc. or its licensor. All computer software documentation contained herein is Commercial Computer Software Documentation, proprietary to GenRad, Inc. or its licensor and furnished under limited license only. For solicitations issued by the United States, its agencies or instrumentalities (the “Government”) on or after December 1, 1995 and the Department of Defense (“DoD”) on or after September 29, 1995, the only rights provided in the Commercial Computer Software Documentation shall be those specified in a license customarily provided to the public by GenRad, Inc. in accordance with FAR 12.212 (a) and (b) (OCT 1995) or DFARS 227.7202-3 (a) (JUN 1995). For solicitations issued before December 1, 1995 by the Government (other than DoD) use, duplication or disclosure of the documentation shall be subject to the RESTRICTED RIGHTS as set forth in subparagraph (c) (1) and (2) of the commercial computer software – restricted rights clause at FAR 52.227-19 (JUN 1987). For solicitations issued before September 29, 1995 by DoD: RESTRICTED RIGHTS LEGEND – The use, duplication, or disclosure by the Government is subject to restrictions as set forth in subparagraph (c) (1) (ii) of the Rights in Technical Data and Computer Software clause at DFARS 252.227-7013 (OCT 1988).

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The Difference in Software is the Difference in Test The Technology of Knowledge TRACS TRACS III VIPER VXIscan XL XP Xpress Model Xpress Nail Xtended Performance

Product names listed are trademarks of their respective manufacturers. Company names listed are trademarks or trade names of their respective companies.

The material in this manual is for informational purposes only and is subject to change, without notice. GenRad assumes no responsibility for any error or for consequential damages that may result from the use or misinterpretation of any of the procedures in this publication.

ii

GenRad

We at GenRad strive to achieve the highest possible customer satisfaction through innovative products and services, and continuous improvement of our product quality and support. To help us achieve our goal, we ask that you:

z

Please fill out and return the Reader Comments card, located at the back of this manual, if you have any suggestions for structure or content improvements.

z

Please document any product problems or enhancement requests on the GenRad System Performance Report forms, supplied with the equipment documentation, and return them to the GenRad Customer Care Center (CCC). The contact addresses are in the Preface of this manual.

Thank you for choosing GenRad as your integrated diagnostic solutions provider.

iii

List of Effective Pages Total number of pages in this publication is 114. Issue Original

Date December, 1999

Page No.

Manual and Binder Reorder No. N/A

Manual Reorder No. 9007–4008–03

Issue

Title . . . . . . . . . . . . . . . . . . . . . Original ii through xvii

. . . . . . . . . . . . Original

1–1 through 1–15 . . . . . . . . . Original 2–1 through 2–20 . . . . . . . . . Original 3–1 through 3–36 . . . . . . . . . Original 4–1 through 4–10 . . . . . . . . . Original A–1 through A–3 . . . . . . . . . . Original Index–1 through Index–5 . . . Original

v

WARNINGS z

Do not remove covers. Potentially lethal voltages are present inside the system. Observe all WARNING markings on the equipment and WARNING notices in the manual. If servicing is necessary, it should be performed only by a qualified person familiar with the electrical shock hazards present inside the system.

z

Grounding circuit continuity is vital for safe operation of the equipment. Never operate equipment with grounding conductor disconnected.

z

Safeguard your hands and fingers while handling any fixture or other accessory. Be sure it is securely supported if you reach under it. If it is heavy, you must have another person help to move it.

z

The symbol ! on equipment signifies that the manual contains information to prevent injury or equipment damage. Observe and heed all WARNING notices in the manuals and the equipment. WARNINGS call attention to personnel safety information.

z

Replace any fuse only with the same type and ratings as labeled on the equipment and/or listed in the manual.

IEC417

MISES EN GARDE z

Ne pas enlever les couvercles. Les niveaux de tension se trouvant dans le système sont extrêmement dangereux. Respectez toutes les consignes de sécurité figurant sur l’équipement et les MISES EN GARDE données dan ce manuel. Seule une personne qualifée, connaisant les risques de décharge électrique du système, est autorisée à effecteur les opérations de nettoyage ou de réparation du système.

z

Le circuit doit être mis à la terre sans discontinuation pour garantir un fonctionnement sans danger de l’équipement. Ne jamais faire fonctionner l’équipement pendant que le raccord à la terre est déconnecté.

z

Protégez–vous les mains et les doigts pendant le maniement de tout dispositif de serrage ou autre accessoire. Assurez–vous que ceux–ci soient bien solidement fixés en place, avant de vous pencher sous eux. Si l’accessoire en question est trop lourd, faites–vous aider pour le déplacer.

z

Le symbole ! figurant sur l’équipement signifie que le manuel contient des informations permettant d’empêcher les accidents ou l’endommagement de l’équipement. Respectez toutes les consignes de MISES EN GARDE données dans le manuel et figurant sur l’équipement. Les MISES EN GARDE attirent l’attention sur la nécessité de se protéger.

z

Ne remplacez les fusibles qu’avec des fusibles du même type et de la même valuer que ceux mentionnés sur l’équipement et figurant dans le manuel.

IEC417

WARNHINWEISE

vi

z

Abdeckungen nicht entfernen. Potentiell lebensgefährliche Spannungsbedingungen innerhalb des Systems vorhanden. Alle auf der Einrichtung befindlichen WARNMARKIERUNGEN und im Handbuch enthaltenen WARNHINWEISE beachten. Wartungsarbeiten dem qualifizierten Personal überlassen, das mit den innerhalb des Systems vorhandenen Gefahren eines elektrischen Schlags vertraut ist.

z

Die Erdung des Schaltungsdurchgangs ist eine Grundvoraussetzung für den sicheren Betrieb der Einrichtung. Einrichtung niemals ohne Erdleiter betreiben.

z

Hände und Finger bei der Handhabung einer Spannvorrichtung oder eines anderen Zubehörteils schützen. Sich vor der Plazierung der Hände unterhalb der Einrichtung vergewissern, daß die Einrichtung über ausreichenden Halt verfügt. Falls die Einrichtung schwer ist, sich von einer anderen Person beim Tragen helfen lassen.

z

Das auf der Einrichtung befindliche Symbol ! bedeutet, daß das Handbuch Informationen zur Verhinderung von Körperverletzungen oder Sachschäden enthält. Alle in den Handbüchern enthaltenen und auf der Einrichtung befindlichen WARNHINWEISE beachten und befolgen. WARNHINWEISE sollen auf Informationen zur persönlichen Sicherheit aufmerksam machen.

z

Sicherungen nur durch Sicherungen des gleichen Typs und der gleichen Nennleistung ersetzen. Auf der Einrichtung befindliche Etiketten und im Handbuch enthaltene Informationen zu Rate ziehen.

IEC417

AVISOS z

Não remova as tampas. Há voltagens potencialmente fatais presentes na parte interna do sistema. Observe todas as marcações de AVISOS no equipamento e discrições de AVISOS no manual. Se for necessário fazer manutenção, esta deve ser feita somente por uma pessoa qualificada familiarizada com os perigos de choques elétricos presentes na parte interna do sistema.

z

A continuidade do circuito de aterramento é vital para a operação segura do equipamento. Nunca opere o equipamento com o cabo de aterramento desligado.

z

Proteja as suas mãos e dedos ao operar qualquer dispositivo ou outro acessório. Certifique–se que ele esteja suportado com segurança se você tiver que alcançar algo debaixo dele. Se for pesado, você deve ter a ajuda de uma outra pessoa para movê–lo.

z

O simbolo ! no equipamento significa que o manual contém informações para prevenir ferimentos ou danos ao equipamento. Observe e preste atenção a todos os AVISOS nos manuais e no equipamento. Os AVISOS chamam a atenção a informações sobre a segurança pessoal.

z

Substitua qualquer fusivel somente com um do mesmo tipo e da mesma capacidade nominal como marcado no equipamento e listado no manual.

IEC417

ADVERTENCIAS z

No quitar las tapas. En el interno del sistema hay voltajes potencialmente mortales. Obsérvense todos los rótulos de ADVERTENCIA presentes en el equipo, así como la descripción de las notas de ADVERTENCIA presentadas en el manual. De ser necesario, el servicio de mantenimiento deberá ser efectuado únicamente por personal calificado que esté familiarizado con los peligros de choque eléctrico presentes en el sistema.

z

La continuidad del circuito de puesta a tierra es de vital importancia para el functionamiento seguro del equipo. Nunca se debe usar el equipo con el conductor de puesta a tierra desconectado.

z

Protéjanse las manos y los dedos toda vez que sea necesario manipular un dispositivo u accesorio. Cerciorarse de que el mismo esté firmemente sujetado antes de proceder a trabajar debajo de él. Si el aparato u accesorio fuera pesado, pedir la ayuda de otra persona para moverlo.

z

El simbolo ! que aparece en el equipo significa que el manual contiene informaciones para evitar lesiones personales o daños al equipo. Obsérvense y préstese atención a toda las notas de ADVERTENCIA presentes en los manuales y en el equipo. Las ADVERTENCIAS sirven para llamar la atención sobre informaciones de seguridad para el personal.

z

Reemplazar los fusibles únicamente con otros del mismo tipo y capacidad, según lo indique el rótulo en el equipo y la descripción en el manual.

IEC417

vii

CAUTIONS z

Observe and heed all CAUTION notices in the manuals and on the equipment. CAUTIONS call attention to information about safeguarding equipment from damage.

HANDLING PRECAUTIONS FOR ELECTRONIC DEVICES SUBJECT TO DAMAGE BY STATIC ELECTRICITY Place instrument or module to be serviced, spare parts in conductive (anti–static) envelopes or carriers, hand tools etc. on a work surface defined as follows. The work surface must be conductive and reliably connected to earth ground through a safety resistance of approximately 250 kilohms. The surface must NOT be metal. (A resistivity of 30 to 300 kilohms per square is suggested.) Avoid placing tools or electrical parts on insulators. Ground the frame of any line–powered equipment, test instruments, lamps, soldering irons, etc., directly to earth ground. To avoid shorting out the safety resistance, be sure that grounded equipment has rubber feet or other means of insulation from the work surface. The module being serviced should be insulated while grounded through the power–cord ground wire, but must be connected to the work surface before, during and after any disassembly or other procedure in which the line cord is disconnected. Exclude any hand tools (such as non–conductive plunger– type solder suckers) that can generate a static charge.

viii

Ground yourself reliably, through a resistance, to the work surface; use, for example, a conductive strap or cable with a wrist cuff. The cuff must make electrical contact directly with your skin; do NOT wear it over clothing. (Resistance between skin contact and work surface through a commercially available personnel grounding device is typically 250 kilohms to 1 megohm.) If any circuit or IC packages are to be stored or transported, enclose them in conductive envelopes or carriers. Remove them only with the above precautions; handle IC packages without touching the contact pins. Avoid circumstances that are likely to produce static charges, such as wearing clothes of synthetic material, sitting on a plastic–covered stool (particularly while wearing wool), combing your hair, or making extensive erasures. These circumstances are most significant when the air is dry. When testing static sensitive devices, be sure dc power is on before, during, and after application of test signals. Be sure all pertinent voltages have been switched off while boards or components are removed or inserted.

Contents

Preface Overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

xiii

Audience . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

xiii

About this Manual . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

xiv

Related GenRad Documentation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

xv

Document Conventions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

xvi

GenRad Customer Care Center . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

xvii

Overview GR228X System Architecture . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

1-2

Basic System Components . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

1-3

System Activities . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

1-4

Testing Methods . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

1-4

In-Circuit Testing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

1-6

Functional Testing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

1-7

System Test Devices . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

1-8

Testing Board Continuity . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

1-11

Testing Analog Components . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

1-11

Testing Digital Components . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

1-12

Testing Hybrid Components . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

1-13

Testing Boundary Scan Components . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

1-14

Test Fixtures . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

1-15

In-Circuit Test Fixture . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

1-15

Functional Test Fixture . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

1-15

Introduction to GR228X Test Systems

ix

GR228X Test Systems GR228X System Configurations . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

2-1

GR2280 and GR2281 Production Test Systems . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

2-3

Standard System Hardware . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

2-4

Optional Hardware . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

2-4

GR2281A and GR2287A Production Test Systems . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

2-5

Standard System Hardware . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

2-6

Optional Hardware . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

2-6

GR228X i-Series Test Systems . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

2-7

Standard Hardware . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

2-8

Optional Hardware . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

2-9

GR228X e-Series Test Systems . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

2-10

Standard System Hardware . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

2-11

Optional Hardware . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

2-12

GR2283 and GR2284 Test Systems . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

2-13

Standard System Hardware . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

2-14

Optional Hardware . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

2-14

GR228X Test Systems with Windows NT PC Retrofit . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

2-15

Standard System Hardware . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

2-16

Optional Hardware . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

2-17

UUT Power Supplies . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

2-18

Available UUT Power Supplies . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

2-19

Optional Programmable Voltage UUT Power Supplies . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

2-20

Optional Fixed Voltage Power Supplies . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

2-20

GR228X Test Software

x

Test Development Process . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

3-2

Test Preparation Tools . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

3-3

CB/Test . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

3-3

Circuit Description Generator . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

3-4

System Device Libraries . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

3-4

Model Generation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

3-9

Power Supply Editor . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

3-15

Test Generation Tools . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

3-16

Automatic Test Generator . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

3-16

Preprocessor . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

3-17

Scan Pathfinder . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

3-17

Nail Assignment . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

3-19

Translator . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

3-19

Test Debug Tools . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

3-20

Program Xplorer . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

3-20

Autodebug . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

3-21

Digital Waveform Display . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

3-22

Measuring Fault Coverage (ALLFAULT) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

3-24

Floating Point Array Display . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

3-25

Contents

Generating a Plot . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

3-27

Test Execution Tools . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

3-27

Standard Test Software . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

3-27

PinPoint Guided Probe . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

3-29

TEST XPRESS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

3-29

Panel Test, Split Fixturing, and Serial Numbering . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

3-31

Test Analysis Tools . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

3-31

Real Time Data Collection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

3-31

Data Display . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

3-34

Off-line Programming . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

3-35

ATG Xpress . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

3-35

TRACS III . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

3-35

GRXpert . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

3-35

Migrating from One Test System to Another . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

3-36

Windows NT System Environment Editors . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

4-1

PFE Editor . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

4-2

emacs . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

4-3

vim . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

4-3

Choosing a User Interface . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

4-4

TestFlo Program Preparation Manager (PPM) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

4-4

GR228X Monitor . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

4-5

Online Help . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

4-6

Monitor Page Help . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

4-6

Online Help Topics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

4-6

Online Manuals . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

4-10

Documentation Quick Reference Hardware Documentation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

A-1

Software Documentation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

A-2

Third Party Documentation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

A-3

Index

Introduction to GR228X Test Systems

xi

Preface

Overview This manual introduces you to the GR228X Test Systems by providing you with a brief description of the: z GR228X Test System architecture. z Standard and optional hardware available for each GR228X Test System. z Software that is available to help you develop test programs, and which manual in the GR228X Documentation Set provides detailed information. z Windows NT-based system environment.

Audience This manual will benefit: z Network Manager or Administrator z System Manager or Administrator z Test Engineer z Field Service Personnel z Site Manager z Test Programmer z Operator

Introduction to GR228X Test Systems

xiii

About this Manual This section identifies the knowledge or tasks described in the chapters or appendices of this manual.

xiv

For information about

Read this Chapter or Appendix

The general GR228X System’s architecture, testing strategies, devices tested, and test fixtures

Overview

The standard and optional hardware that is available on your GR228X System and some basic information about power supplies

GR228X Test Systems

The test development process and the software tools available for the GR228X Systems

GR228X Test Software

The Windows NT system environment, test editors, user interfaces, and how to get help

Windows NT System Environment

Where to find information about a task in the documentation set; where to find 3rd Party (non–GenRad) documentation information

Documentation Quick Reference

Preface

Related GenRad Documentation This section lists other GenRad manuals that may provide supporting or related information. Manual Title

How it relates or supports this manual

GR228X Test Program Generation Manual

Provides detailed information about the test program development process

PinPoint Guided Probe User’s Guide

Provides detailed information about using PinPoint Guided Probe

Meeting the Challenge of Boundary Scan

Provides an informal introduction to boundary scan

GR228X Test Fixture Manual

Provides detailed information about creating test fixtures

GR228X Production Test User’s Guide

Provides information that is necessary to perform production testing on UUTs

GR228X Test Language Reference Manual

Provides detailed information on creating tests using the test language statements

GR228X Test Library Programming Manual

Provides detailed information on creating analog, digital and hybrid models

GR228X Master Index

Provides a method for locating specific information within the documentation set

BasicSCAN Boundary Scan User’s Guide

Provides detailed information about using BasicSCAN to test boundary scan components

Xpress Model User’s Guide

Provides detailed information on generating models using the Xpress Model option

GR228X Scan Pathfinder User’s Guide

Provides detailed information on generating tests for boundary scan components

GR228X Test Program Debug Manual

Provides detailed information on debugging test programs

Test Xpress User’s Guide

Provides detailed information on generating open pin tests

GR228X Panel Test, Serial Numbering, and Split Fixturing Manual

Provides detailed information on testing a panel of boards, using serial numbering, and testing UUTs using a split fixture

GR228X Migration User’s Guide

Provides detailed information on migrating from one test system to another

GR228X System Administration User’s Guide

Provides information on using the Windows NT system environment administration and operation

GR228X Advanced Applications

Provides application programs illustrating test methods that will help you to develop similar applications.

ATG Xpress User’s Guide

Provides information to develop a test program off-line on a PC.

Introduction to GR228X Test Systems

xv

Document Conventions The following document conventions are used throughout the documentation set. Convention

Indicates

Bold monospace text

command text that you enter

Bold text

commands, keys, buttons, prompts, menu options, icons, and literals within text

Courier text

command, syntax, or error message

Italic monospace text

replace the term with a valid entry

Italic text

manual title, chapter title, or section title

P/N or PN

part number

[text, text]

field within the brackets is optional

{text, text}

select one or more choices within the braces

CAUTION

potential harm to the system or equipment as a result of this action

Example

the beginning of an example

End Example the end of an example

!

xvi

NOTE

specialized information that may benefit you

NEXT

informational options that direct you to the next chapter or step

WARNING

potential harm to you as a result of this action

Preface

GenRad Customer Care Center GenRad offers customer support through the GenRad Customer Care Center (CCC). You can contact the Customer Care Center for assistance at any time if you are unable to solve a problem through the use of on-line help or product documentation. If the Customer Care Center is closed when you call, you can leave a voice mail message by phone. Before contacting the Customer Care Center, please have the following information available: z Your site number z Hardware system type z System serial number z Software version number You can contact the Customer Care Center by: Phone

(978) 589-7000 USA only: 1–800–4–GENRAD (1-800-443-6723) Select the number 1 to connect to the Customer Care Center.

Fax

(978) 589-2080 (Customer Care Center) (978) 589-7007 (GenRad Main)

E–mail

[email protected]

Mail

GenRad, Inc. 7 Technology Park Drive, MS 6 Westford, MA 01886-0033

World Wide Web

http://www.genrad.com

FTP

ftp.genrad.com login: anonymous password: your e-mail address cd pub/pub (public, for directory use ls) or cd pub/incoming (public, directory cannot be seen)

Introduction to GR228X Test Systems

xvii

1

Overview

The GR228X Test Systems, hereafter referred to as the GR228X systems, are a family of PC-controlled combinational test systems. The systems are designed to perform rapid electrical testing of printed circuit boards with high diagnostic accuracy. The GR228X systems run on a Windows NT-based software platform and are configurable to meet the hardware and software requirements of the target application. Your GR228X system’s primary purpose is to execute in-circuit tests on electrically-isolated components of a unit–under–test (UUT). Such components include analog IC, digital IC, hybrid IC, and memory components. NOTE

The GR2281A and GR2287A Test Systems do not have digital test vector capabilities, but can detect opens on digital components using the TEST XPRESS software.

A GR228X system is particularly effective at detecting manufacturing faults, such as: z Shorts and opens within components or on board etches z Missing, wrong, damaged, or improperly inserted components z Out of tolerance and faulty components z Incorrectly programmed components and faulty memory devices z Functional faults on complete circuits This chapter provides an introduction to all Windows NT-based GR228X Test Systems, which include any VMS-based GR228X Test Systems that have been retrofitted with a Windows NT-based PC.

Introduction to GR228X Test Systems

1-1

GR228X System Architecture All Windows NT-based GR228X systems are PC-controlled and have similar standard and optional hardware components. Table 1–1 describes each of the GR228X system’s major components that are shown in Figure 1–1.

CD–ROM DRIVE

HARD DISK DRIVE

VIDEO DISPLAY

MOUSE

HARDWARE KEYPAD (Optional)

KEYBOARD

REPAIR TICKET PRINTER

MODEM

DISKETTE DRIVE

1/4–INCH TAPE DRIVE

TEST FIXTURE RECEIVER PROCESSOR

TEST INSTRUMENTS

Figure 1–1

LINE PRINTER

42601.3

System Components

Table 1–1 GR228X System Components

1-2

Component

Description

Mouse

Used to select options and enter input.

Keyboard

Used to enter commands to the PC or to respond to system prompts and test boards.

Hardware Keypad

This option enables you to test UUTs easily without constantly using the keyboard.

Video Display

Used during program preparation and during the testing sequence to display measurements, waveforms, error messages, and other operator information.

Repair Ticket Printer

Prints diagnostic messages and results from the PC. Used by the test system to document test results and error messages, which can be attached to the failing boards.

Line Printer

This option is available for hard-copy output of program listings and log listings.

CD-ROM

Used to load CD-ROM formatted software.

Hard Disk Drive

Stores system software, test programs and data, and any other information that the PC needs to quickly access. Optional disk drives may be added to provide additional storage.

3.5-inch Diskette Drive

This 1.44 Mb diskette drive is used for system backup and data transfer.

1/

This 525Mb tape drive is used for loading system software and for system backup.

4-inch

Tape Drive

Modem

An internal modem for remote accessing.

Processor

Executes the test programs.

Overview

Component

Description

Test Instruments

The source and measure instruments perform a variety of device tests. For example, by forcing a known voltage from the dc source and measuring the current, the software computes the value of dc resistance under test using Ohm’s Law (R=E/I).

Test Fixture Receiver and Support Circuitry

Provides an interface between the test instruments and the variety of boards that undergo tests. Fixtures, which are uniquely fabricated for each board design to be tested, are mounted to the test system’s receiver. Through the fixture, the test system establishes electrical connections between the test instruments and individual components on the UUT.

Basic System Components The GR228X systems include a variety of specially designed interconnected modules and components that provide easy access at the front for UUT testing and at the rear for equipment servicing. Internal ventilation is provided by positive pressure air circulation from air intakes on each cabinet. Figure 1–2 shows the system as a block diagram. The basic system contains a PC, analog and digital subsystems, a receiver, and UUT power supplies. NOTE

The GR2281A and GR2287A Test Systems do not contain a digital subsystem.

STRIP PRINTER

ANALOG SUBSYSTEM PERSONAL COMPUTER

MXI-TO-GENRAD (MTG) INTERFACE DIGITAL SUBSYSTEM

GR228X Test System

UNIT UNDER TEST

RECEIVER

UUT POWER SUPPLIES 42541.1

Figure 1–2

Introduction to GR228X Test Systems

Basic System Block Diagram

1-3

System Activities Figure 1–3 identifies activities that are needed to use the system effectively. The activities are grouped under four major functions.

GR228X Test System

System Management

Set Up System

Develop Test Programs and Fixtures

-

Prepare Site

-

-

Install Hardware

-

Maintenance

Production Testing

and Service

-

Perform UUT Testing

-

-

Use Window NT Operating System Customize Environment

-

Routine Maintenance

-

Load Software

-

Choose an Editor

-

Collect and Analyze Test Data

-

-

Create User Accounts

-

Identify Test Program Development Process

-

Run Verification Programs

If Test System fails, Run Diagnostic SelfĆTests

-

-

SetĆup System

-

Build, Test, and Debug Test Fixture

Remove and Replace Defective System Parts

SetĆup Network

-

Develop Test Program

-

Debug Test Program

-

Release Test Program for Production Testing

-

Figure 1–3

Perform Preventative Maintenance Calibrate Instruments

31953.1

GR228X Test System Activities

Testing Methods There are two testing methods available for the GR228X systems; in-circuit and functional. Both methods can produce tests that identify a high percentage of all possible defects. Depending on the assembly stage, either the in-circuit or the functional testing method is easier to implement and provides the most useful information. In-circuit tests are usually performed at earlier and intermediate stages of assembly when it is most important to identify and correct component faults. While the in-circuit test does not provide direct information about how well a board functions, experience shows that most boards that pass an in-circuit test can also pass a thorough functional test. Therefore, even though the in-circuit test does not determine whether the whole board works correctly, it can indicate whether a board should continue through assembly or whether it has faults that need repair. Once it is established that all components are correctly inserted and are operational, board–level functional tests or quality control tests can be useful for verifying a board’s overall performance. Functional tests are usually performed in the later stages of assembly when access is only available at the board edge.

1-4

Overview

A dedicated functional test system is often used for functional testing. Alternatively, you can move many of the functional tests to the GR228X Test System which has many of the necessary hybrid test capabilities built-in. The ICA systems contain instruments for testing groups of analog components, groups of ICs using the system’s parallel Driver/Sensors, and groups of hybrid components using the AWG, DMM, and ACM in addition to the other instruments. Functional testing may require the addition of optional power supplies. The Hybrid Test Library (HTL) enables you to develop a library of functional tests that can be automatically generated. Functional testing enables you to collect additional test statistics using the system’s data logging feature. In-circuit testing individually checks the performance of each component on the board with little or no operator probing. Occasionally a fault such as an open connection needs to be localized further. The GR228X systems offer a scratchprobing technique that can discriminate between a poor test probe contact, a bent IC pin that was not inserted correctly, or a broken track. Performing a combination of in-circuit and functional tests provides the most thorough fault coverage. The GR228X software and hardware are optimized for in-circuit component testing, therefore, the test development process focuses on in-circuit testing. GR228X systems can also perform “clusters” of functional tests using the same test fixture. By grouping the UUT into functional clusters, you can simplify test development and improve the diagnostic accuracy of failing cluster tests. Table 1–2 identifies and contrasts the major characteristics of functional and in-circuit testing. Table 1–2 Functional and In-Circuit Test Characteristics Characteristic

Functional (Board-Edge) Test

In-Circuit Test

What is tested

Component inputs and outputs.

Component connections, values, and functions.

How is it tested

Power is applied to the board.

Component-by-component; power is applied to UUT for digital and hybrid tests.

Fixture requirements

Board edge connector that may accept many boards.

Bed-of-nails fixture for each board design.

Software requirements

Can use an optional circuit simulator as a diagnostic aid to predict outputs and fault coverage. Test development requires a simulator library, and a programmer to write part of the test. It requires a longer test development cycle.

Automatic Test Generator (ATG) writes the test using test libraries. The hybrid library can generate functional tests.

Component library

Must contain complete transfer function or truth table for each digital device.

Contains analog, digital, and hybrid model tests, written for a variety of circuit environments.

Fault diagnosis

Provided by guided operator probing; fault identification depends on adequate simulation.

Probing is not required to obtain good fault identification.

Fault coverage

Excellent fault coverage, although both the test development and debug time are lengthy. Also, manufacturing faults may not be detected.

Excellent fault coverage with fast test development and debug time.

Introduction to GR228X Test Systems

1-5

InĆCircuit Testing In-circuit testing methods are used to check for manufacturing faults. Manufacturing faults are defects in individual components and inter-connections on the board. To test components individually, connections from the test system to all functioning component pins is required. This is accomplished using a test fixture that mates with each of the board’s circuit nodes and test methods that can effectively isolate a single component from the parts surrounding it. An in-circuit component test is often performed as the first or second test after a board has been assembled and soldered. It may be preceded by a separate bare board test to check for opens and shorts in the conductive tracks before parts are inserted. In-circuit tests generally fall into four test categories: z Connectivity tests that check for shorts and open connections on the board. z Analog tests that measure component values. z Digital tests that check the operation of digital integrated circuits. z Hybrid tests that check components that are a combination of analog and digital components. The System contains test hardware appropriate for each kind of test, but it must be connected to each part on the board individually before you can perform a test. Since components are tested individually, the system can usually localize a fault immediately and issue a report telling the operator or technician which part needs repair. Interactive faults that can cause the board to malfunction are generally overlooked, but such faults are rare on a well–designed board. The in-circuit tests are generated by the Automatic Test Generation (ATG) software. Programmers who need to modify tests created by ATG or who need to write tests of their own should thoroughly understand these techniques and the criteria ATG uses in selecting various test methods. The most troublesome aspect of the in-circuit test is the assumption that you can test each component as if it were the only part on the board. Fairly complex test strategies are often required to analyze the component’s circuit environment and to isolate the component from the surrounding circuits. Since these test strategies involve only individual components and their immediate circuit connections, you can assemble libraries of standard test procedures and adapt them to the limited range of environments in which the components are found. Given an appropriately coded description of the circuit, the system software can write the entire board test by drawing tests for individual components from test libraries. VLSI devices are tested in a way that is, in principle, no more complex than the method used for simple components. The system does not need to know the entire truth table or transfer function of a digital device, since it does not analyze how signals move through the circuit. Instead, it only requires that the library contain a set of typical input and output patterns for each device that is used to test the device. For a simpler digital IC, these patterns are usually based on the device’s truth tables, but for a larger device, they may consist of no more than a carefully chosen sample of the possible inputs and outputs. Bused ICs present a special class of challenges. Before full tests are performed on bused devices, all the devices on the bus are tri–stated, that is, put in a low current state to verify that the bus is free. If the bus test fails, the BUSBUST diagnostic technique can automatically identify the IC(s) causing the bus failure. Once the bus test passes, you can individually test the performance of each IC on the bus. All other devices on the bus are disabled or disconnected from the bus and the IC is tested as if it were the only device on the board. For an in-depth explanation of in-circuit testing strategies, refer to the GR228X Test Program Generation Manual.

1-6

Overview

Functional Testing Functional circuit testing is often used to identify any faults that went undetected by in-circuit testing. A functional test is most important to the end user of a circuit board because it certifies that the board meets its performance specifications. To connect the unit–under–test (UUT) to the test instruments, you must construct a fixture that mates easily with the board and provides reliable electrical connections. Usually, you only need to test the board’s inputs and outputs, and the fixture needs to provide little more than the board’s normal interface connectors. Therefore, the test fixture can be relatively simple and inexpensive to construct, which is especially attractive for low–volume testing. Using a functional tester, it is often possible to test a variety of bus–oriented boards from an edge connector in a single fixture. With power applied to the board, a functional test checks that the board, or chosen sections of the board, produces the desired output response when various input stimuli are applied. Functional testing can also check that further stages of assembly have not damaged the board. When a board fails a functional test, the test cannot always identify the cause of the fault immediately since there can be any number of paths from the inputs to the outputs along which the fault might lie. As boards become more complex, the possible signal paths become much longer, and the simple information that a particular board output has failed becomes less useful in identifying the cause of the failure. After a board fails a functional test, a technician usually has to trace the fault from the output back to its origin. Since ATG does not generate functional test programs, you must write a test in the system’s test language. The test you develop needs to apply an appropriate stimulus, a waveform or a bit pattern, at the board’s inputs and measure the outputs to determine if the board or a group of components, such as a filter section, are functioning properly. When a sophisticated functional test is required, or if diagnostic information can be gained from the functional test, some proficiency in manual programming in the test language may be required. For functional testing, you can use software to adapt the output of simulator models to the GR228X test language to form digital models of function units. You can then use the PinPoint Guided Probe for testing a function unit. The guided probe provides an important capability for diagnosing functional faults. Refer to the PinPoint Guided Probe User’s Guide for more information. The PinPoint Guided Probe is ideally suited for tracking digital functions. Using a probe connected to a signal tracer or logic analyzer, is not as efficient as using PinPoint Guided Probe. If the PinPoint Guided Probe capability is to aid in locating the fault, it must have a software model of the board’s circuits available so that it can compute the possible signal paths and guide the operator to probable sources of the error. However, when you perform a functional test in conjunction with an in-circuit test, the in-circuit test is often sufficient to identify component faults that cause functional failures. To model a circuit, the simulator must be able to predict the state of each pin as a signal propagates from the inputs to the outputs. A complete truth table for each digital device on the board must be available so that for each input pattern that appears at an IC’s inputs, it can find the resulting outputs and advance to the next devices. This has important consequences for functional testing of boards containing VLSI devices. For SSI and most MSI devices you can record the truth tables without difficulty; however, for some VLSI devices such as microprocessors, the truth tables comprise from 10,000 to several million test vectors. For these devices you must find other less thorough methods for simulation. In general, adequate software modeling of boards containing VLSI devices is a formidable and expensive task. For an explanation of functional testing strategies, refer to the GR228X Test Program Generation Manual.

Introduction to GR228X Test Systems

1-7

System Test Devices The GR228X test language controls the system test hardware and software devices,which enable you to test and measure the components on the UUT. Figure 1–4 provides a global view of the system test devices. Table 1–3 describes the function of the hardware and software devices.

AWG

DMM ARITH [1]

PIO

ACM STM

ICA ACZ

UUT

AFTM DCS MUX

SCAN

PEX

DCM RM [1] SVS SHORTS, OPENS, AND CONTACT [1]

LGC [2]

[3]

UPS

[3]

I488 (BUS OPT)

DSM

PVS/HCS [3]

TEST PINOPENS [1]

PS NOTE: [1] Not actual instruments, they are software drivers [2] LGC may include standard digital test nails and/or special nails [3] Power supplies for UNIX PC Retrofitted Systems 31936.0

Figure 1–4

1-8

System Test Devices

Overview

Table 1–3 System Test Device Functions Acronym

Device Name

Function

ACM

Digital AC Voltmeter/Ammeter

Measures a signal’s positive peak, negative peak, RMS, or dc offset (Voltages up to 200 V and currents up to 160 mA for signals between 1 Hz and 40 kHz.).

ACZ

AC Impedance Measure

Measures impedance or admittance by applying the ac source voltage and measuring the result.

AFTM

Analog Functional Test Module

The AFTM option contains these analog instruments: DC Voltmeter, AC Voltmeter, AC Source, TTL Sync Signal Output, Frequency/Time-Interval Meter.

ARITH

Arithmetic Test Module

Tests arithmetic quantities not directly measured by an instrument, such as the gain of a transistor. This utility device is considered a system device because the action required when it fails is the same as other instrument statements.

AWG

Arbitrary Waveform Generator

Sources voltage or current waveforms. Programmed waveforms can be sine, square, and triangle. You can also define arbitrary waveforms.

DCM

DC Measure

Uses a differential voltmeter and an ammeter to measure dc voltage. The DCM module on an ICA-configured system has a wider range than on a non-ICA configured system.

DCS

DC Source

Serves as voltage source (DCV) or current source (DCI). The DCS module on an ICA-configured system has a wider range than on a non-ICA configured system. Trigger command available for ICA systems only.

DMM

Digital Multimeter

Measures voltage and current. Permits immediate or triggered voltage and current sequence measurements which are then stored in the DMM’s memory.

DSM

Deep Serial Memory

Extends test system memory by supplying state data to the Driver/Sensors through the digital instrument bus.

I488 (BUS OPT)

IEEE Standard 488–1978

Permits up to nine external devices that conform to IEEE Standard 488–1978. These external devices can be attached to the system, then operated remotely by test language statements.

LGC

Logic Driver/Sensors

Digitally controls the D/S subsystem for standard digital testing.

Introduction to GR228X Test Systems

1-9

Table 1–3 System Test Device Functions

1-10

Acronym

Device Name

Function

MUX

Instrument Multiplexer

Relay matrices used to connect selected instruments to any of four (A, B, C, D) or eight (A, B, C, D, E, F, G, H) output channels.

PEX

Pin Expander

Connects Driver/Sensor or analog BUS lines to a larger number of pins.

PINOPEN

Open Pins

This software driver tests for open pins on selected components and connectors. It uses various tester instruments depending on your tester configuration and selected PINOPEN options.

PIO

Parallel I/O

Reads driver outputs and monitors TTL inputs. This utility device consists of program controlled driver circuits that activate relays, TTL circuits, LED indicators, and sensor circuits.

PS

Programmable Supply

Power supply option used on the Windows NT-based GR228X Systems to power the UUT.

RM

Resistance Measure

Uses an ohmmeter to measure resistance.

SCAN

Analog Pin Scanner

Uses relay matrices to connect the MUX channels to designated UUT nails.

SHORTS OPENS CONTACT

Shorts Opens Continuity

Connects the DCS and DCM to perform analog continuity tests. The DCS and DCM go through the MUX and SCAN, to connect source and measure units to the UUT.

STM

Self–Test Module

This utility device contains circuits and components of known values that check how the various system test devices operate.

SVS UPS PVS/HCS

Selectable Voltage Supply; Universal Power Supply; High Current Supplies

Power supply options used on the Windows NT-PC Retrofitted GR228X Systems to power the UUT.

UUT

Unit Under Test

Printed circuit board that you are testing.

Overview

Testing Board Continuity Continuity tests are the first set of in-circuit tests that ATG generates. Continuity tests identify shorts and opens in the circuit board connections by: z Measuring the resistances between all possible node pairs. z Checking unconnected nodes for very high resistance. z Checking connected nodes for very low resistance. Optionally, you can select a test that verifies the integrity of the connections between the receiver, fixture, and UUT. This test checks for a leakage path between source nodes and sense nodes on the UUT. If a leakage path does not exist, it usually means that the receiver, fixture, or UUT is not making electrical contact. The scratchprobing diagnostic technique is another form of connectivity testing that you can use to determine if a component failed because of a bad connection on the UUT. You use a probe for this test. When a component fails, the operator can be instructed to probe the pins of the failed component. This tests the connection from each IC pin to the test probe. It verifies that the connection from the test probe to the IC pin is intact and whether the IC or the board connection needs repair.

Testing Analog Components Analog testing is usually performed with no power supplies or ground reference applied to the UUT. Passive analog components are tested by applying an external stimulus to the component, either voltage or current, and measuring the results. Tests of more complex devices, such as active filters, usually require power. In either case, appropriate source and measure instruments are connected to component pins on the board. The source instruments force a voltage or current input. The Measure instruments measure the voltage or current output. ATG automatically analyzes the circuitry surrounding each analog component and then searches the Analog Test Library (ATL) for an appropriate measurement configuration. ATG uses the library procedure as a template for the test to: z Select source, measure, and guard terminals. z Calculate the unknown component value. z Check for error conditions. The ATG test selection process can generate these basic impedance test configurations: z 2-terminal unguarded measurement and 4–terminal Kelvin measurement z 4- and 6-terminal guarded measurement z 6-terminal guarded Kelvin measurement

Introduction to GR228X Test Systems

1-11

ATG can also determine if a test system has an 8–wire mode, and, when appropriate, writes accurate 8–wire resistor tests for low value components. Each in-circuit analog test that ATG generates: z Defines relevant measurement parameters, such as resistance, capacitance, or gain, and selects a stimulus current or voltage for measuring it. z Determines how the device can be isolated from its circuit environment so that interactions from other components do not affect the measurement. z Connects the appropriate circuit nodes to the tester’s measurement instruments so that it can issue relay commands. In some cases, both analog and digital test strategies are used to accomplish these ends. Fortunately, most testing problems are solved by the ATG software, using programmed circuit analysis and libraries of test procedures for circuit components to develop tests for the board.

Testing Digital Components NOTE

The GR2281A and GR2287A Test Systems do not have digital test vector capabilities, but can detect opens on digital components using the TEST XPRESS software.

Digital component testing requires a method of testing the device and a method of isolating it from the surrounding devices or from adjacent buses. The device test requires a set of known logic states applied to the device’s inputs, and a set of expected output states that the device should produce. These input and output bit patterns, called test vectors, usually reflect the truth table associated with the device. To allow the device to function, power and ground are applied to the device during the test. Digital component testing is actually several tests that are performed in this order: z Non–bused IC tests are performed before full tests on the bused devices. z Bus connections are tested by attempting to free the bus from all the devices connected to it. A digital circuit component test usually requires a large number of simultaneous input and output test vectors. Accordingly, the test hardware for digital testing consists of a relatively large number of Driver/Sensor circuits. Test programs are written as if a separate Driver/Sensor were available at each test probe. The actual number of Driver/Sensors is, however, much smaller than the number of available probes. The system software arranges connections from the Driver/Sensors through a relay–based multiplexing system, so you can connect all probes to the Driver/Sensors. This means that a program cannot actually use all of the test probes at once; but test programs rarely need to use more than 250 probes at any one time. Each Driver/Sensor contains built–in, programmable pull–up and pull–down resistors that connect to the logic high and low drive voltages. These resistors are commonly used to simplify the sensing of open–emitter and open–collector outputs. In bus testing, the pull–down resistors are first used to pull the bus lines low. If the pull–down resistors can bring the bus lines to a low voltage level, you can assume that the bus is in a high impedance state, at least in the high voltage range. The programmable pull–up resistors are connected to the logic high voltage, and the bus lines are checked for logic highs. These two tests verify that no device is driving the bus at the low logic level.

1-12

Overview

The output of each driver normally functions as a programmable voltage source, generating highs and lows at voltages the test program determines. To test open–collector, open–emitter, and tri–state devices, the Driver/Sensor can switch in a pair of pull–up and pull–down resistors. A sensor is simply a voltage comparator that returns a logic 1 for all voltages above a certain programmed threshold, and a logic 0 for voltages below a second programmed threshold. Values falling between the two thresholds fail tests for both high and low. A digital test is conducted by applying as many input combinations to the device’s inputs as the circuit connections allow. Inputs tied high or low cannot be tested and inputs tied together cannot be tested separately. Using the truth table or an appropriate set of test vectors, the test system checks the outputs for the expected high and low states. Within certain limits, you can specify the device’s current and voltage parameters, as well as signal delays, in the test. In-circuit digital tests generally, however, are meant to verify the device’s logical functions rather than its electrical parameters.

Testing Hybrid Components A hybrid test is a test that usually includes both analog and digital test statements. Hybrid tests are effective at generating tests for multiple components that are tested as a function (such as filters, pulse width modules). Examples of other hybrid devices include: programmable gain amplifiers and analog–to–digital converters. Hybrid tests can be generated on GR228X test systems. Hybrid tests can use any of the system’s test instruments to construct the test to measure a component or group of components. The Hybrid Test Generator (HTG) uses hybrid library models that effectively take advantage of these GR228X test software features: z TRIGGER statement that synchronizes the source and measurement instrument timing. Both single–step and continuous triggering are permitted. z Floating–point arrays and system subroutines that simplify the handling of large amounts of data. The test language includes routines to process and display array data. A test program can use arrays with up to 32K elements. The subroutines can perform: Simple mathematical calculations on arrays of real numbers Mathematical calculations on complex vectors Discreet Fourier Transforms, Fast Fourier Transforms, and Inverse Fast Fourier Transforms z Arbitrary Waveform Generator (AWG) that provides various input stimulus to test a circuit’s response. You can create a multi–tone signal that increases testing efficiency. By combining multiple tones into a single waveform, tests can be performed in parallel. z Digital Multimeter (DMM) that performs voltage and current sampling on digitized analog signals for applications requiring tests like signal/noise ratio calculations, spectral analysis, and slew rate calculations. Sampling a waveform enables you to compare the frequency response of a device output to the input signal generated by the test system. z AC voltage and current meter (ACM) that performs RMS, peak, and DC–offset measurements on analog signals.

Introduction to GR228X Test Systems

1-13

A hybrid test is generated from a hybrid model. The hybrid model can contain both unpowered and powered sections that define how the hybrid device is tested. Unpowered section tests are performed on the passive section of a component or group of components. The unpowered hybrid test is inserted in the test program after the analog in-circuit tests and before the power up routine. Powered section tests are performed on the key operating parameters of a device or group of devices. The powered hybrid test is inserted in the test program after the power up routine and before the digital tests. These tests can contain a digital burst. When both unpowered and powered tests are within the same model, ATG splits the test and places the sections in the appropriate place within the program. For examples of these advanced test techniques, refer to the GR228X Advanced Applications.

Testing Boundary Scan Components Boundary scan is a structured design-for-testability method applicable to digital devices. The phrase “design-for-testability” refers to the on-going effort by both component and board designers to improve the observation and control of their designs during test. NOTE

The GR2281A and GR2287A Test Systems do not support boundary scan component testing.

Some circuit board assemblies contain boundary scan components. These components offer testing advantages by exercising the components’ internal circuitry to overcome probing limitations. In addition, you can further test the board by exercising boundary scan components to perform self-tests. To improve UUT fault coverage and diagnostics, GenRad combines traditional in-circuit test techniques with boundary scan test techniques. GenRad offers two optional software products that perform in-circuit testing of boundary scan components: z BasicSCAN is very effective for testing UUTs that contain a few boundary scan components with full access. z Scan Pathfinder is very effective for testing UUTs that contain many boundary scan components with limited access. For further information, refer to Meeting the Challenge of Boundary Scan. This GenRad handbook provides an informal introduction to Boundary Scan. You can obtain this handbook from your sales representative.

1-14

Overview

Test Fixtures A test fixture is a custom built interface that provides reliable electrical paths to the UUT from the system’s analog source and measure instruments, digital driver/sensor circuits, and UUT power supplies. There are many test fixture types. The most common are: z In-circuit (bed-of-nails) z Functional (edge)

InĆCircuit Test Fixture The in-circuit test fixture connects rows of contact nails on the receiver to a bed-of-nails on the top side of the fixture. The nails on the fixture are called test nails, and the nails on the receiver are called receiver nails. Since each UUT is unique, it requires its own in-circuit test fixture. Fixture manufacturers usually provide test fixtures that are completely assembled and wired or test fixture kits that you assemble and wire. No matter who assembles the test fixture, you need to provide UUT and test program information that includes: z Nail Fixture Report (.NFR) file, and optionally, the Nail Wire List (.NWL) file, which is used for short–wire length fixtures, and the CAD design data that contains the X, Y coordinate information for all pins on the UUT. z Your test system’s configuration. z Test program requirements such as special Opens Xpress, Cap Xpress, and Orient Xpress fixture wiring data (.DPR) file. z Fixture Wiring Instructions (.FWI) file, that contains informational messages and instructions to the fixture assembler on how to wire the power supply connections to the test fixture. The Fixture design and construction is coordinated with the test program development objectives. Refer to your test system’s Test Fixture Manual for the reasons and procedures for the various fixture design strategies. Refer to the GR228X Test Program Generation Manual for information on generating reports required for building a test fixture. For information on installing and using a test fixture, refer to the GR228X Production Test User’s Guide.

Functional Test Fixture The Functional test fixture connects the UUT to the system’s test instruments. In functional testing, you only test the inputs and outputs that are at the UUT edge connectors. Therefore, the test fixture need only be a little more than the UUT’s normal interface connectors. The test fixture can be relatively simple and inexpensive to construct, which is especially attractive for low–volume testing. Using a functional tester, it is often possible to test a variety of bus–oriented boards from an edge connector in a single fixture.

Introduction to GR228X Test Systems

1-15

GR228X Test Systems

2

GenRad’s GR228X Test Systems are a family of Windows NT-based PC–controlled, combinational test systems. Providing a variety of GR228X systems enables you to choose the configuration that best suits your board testing needs. This section describes the hardware that comprises the Windows NT-based GR228X Test System.

GR228X System Configurations Each Windows NT-based GR228X Test System is configured differently. A description of the fields used in the GR228X System Configurations appears before Table 2–1. A description of the fields used in Table 2–1 follow. Field Name

Identifies the

System Type

Type of GR228X System.

Pin Board (Type)

System’s performance class.

Pin Board (Max)

Maximum number of pin boards allowed for that system type.

Driver/Sensors per board

Maximum number of driver/sensor (D/S) connections per pin board.

Avail. Nails (Max)

Maximum number of test nails available for that system type.

Mux Ratio

Multiplexing system ratio (i.e. 2 D/S per 16 nails).

Data Rate

Maximum digital subsystem vector speed rate.

Introduction to GR228X Test Systems

2-1

Table 2–1 GR228X System Configurations

System Type

Pin Board (Type)

Pin Boards (Max)

Driver/ Sensors per board

Avail. Nails (Max)

Mux Ratio

Data Rate

Combo I

10


16

1280 

2:16

5 MHz

Combo II




32



2:8

5 MHz

GR2280 GR2281 GR2281A

ASM

10

1280

11

0

1408

2:8

Not Applicable

GR2282 

Combo I

30

16

3840

2:16

5 MHz

GR2283 

Combo I

15

16

1920

2:16

5 MHz



Combo II

15

32

1920

2:8

5 MHz

15

32

1920

2:8

10 MHz

GR2284

GR2285e

XP





Combo I

30

16

3840

2:16

5 MHz

GR2286 

Combo I

30

16

3840

2:16

5 MHz

GR2287 

Combo II

30

32

3840

2:8

5 MHz



Combo II

30

32

3840

2:8

5 MHz

HDC1

30

32

7680

2:16

5 MHz

HDC2

30

64

7680

2:8

5 MHz

GR2287A

ASM 

30

0

3840

2:8

Not Applicable

GR2288 

Combo II

9

32

1152

2:8

5 MHz

30

32

3840

2:8

10 MHz

GR2286

GR2287

GR2287L



GR2287LX



GR2289e

2-2



XP






System allows 11 pin boards if the AFTM is not installed.



1408 if 11 pin boards are present



Analog Scanner Modules



Windows NT PC Retrofitted system



e-Series system or i-Series system



Xtended Performance



High Density Card 1. You must have a minimum of two HDC1s. Optionally, you can populate the GR2287L with up to 28 Combo II pin boards.



High Density Card 2. You can only populate the GR2287LX with HDC2 pin boards.

GR228X Test Systems

GR2280 and GR2281 Production Test Systems The GR2280 and GR2281 Production Test Systems are designed to provide comprehensive testing for small to large scale Printed Circuit Boards (PCB) and assemblies. Each Production Test System provides full analog and digital measurement capabilities for testing. In addition, some functional tests can be performed with the standard system measurement modules. External measurement or source devices, controlled via an IEEE bus interface option, can be added to expand the functional test capabilities. These external instruments can be connected to the system’s scanner subsystem through external multiplexer ports. Figure 2–1 shows the GR2280 and GR2281 Production Test Systems.

42947.0

Figure 2–1

GR2280 and GR2281 Production Test System

Introduction to GR228X Test Systems

2-3

Standard System Hardware The standard system hardware configurations include: Hardware

GR2280

GR2281

Pin board type

Combo I

Combo II

Pin board (max)

10

10

Driver/Sensors per board

16

32

Available nail (max)

1280

1280

Mux Ratio

2:16

2:8

Data Rate

5 MHz

5 MHz

Analog Functional Test Module (AFTM)

Yes

Yes

Analog testing & measurement

Yes

Yes

Digital testing & measurement

Yes

Yes

Clock/Sync/Trigger board

Yes

Yes

High Speed Controller

Yes

Yes

NOTE

If an AFTM is not used in these systems, they can accommodate 11 pin boards and has 1408 available nails.

Optional Hardware The hardware options that can be added to the standard system configurations include: z Increasing the number of pin boards from minimum configurations GR2280 and GR2281 systems can contain up to 10 pin boards, 11 if AFTM is not present. The standard system comes with 2 pin boards. z UUT power supplies in any combination of these voltages: Programmable Voltage (PS) (up to 7 PS in alliance rack)

Fixed Voltage (Fixed) (set of 3 )

0 - 7V @ 15A

+5V @ 6A

0 - 20V @ 8A

+15V @ 1.0A

+5V @ 6A or

+12V @ 1.3A

0 - 60V @ 2.5A z High Voltage DC Voltage Source (+120V). DC Current Measure (+60mA). z IEEE-488 Interface Controller and Instrument Multiplexer z Deep Serial Memory Module (DSM) z Custom Function Board (CFB) with Vehicle Control Interface (VCI) or Frequency Time Interval Instrument (FTI) modules z Bar Code Scanner z Repair ticket printer or line printer

2-4

GR228X Test Systems

GR2281A and GR2287A Production Test Systems The GR2281A and GR2287A Production Test Systems perform analog testing. They do not have a digital subsystem. These systems are designed to quickly identify component faults early in the manufacturing process. Figure 2–2 shows the GR2281A and GR2287A Test Systems.

31830.1

Figure 2–2

GR2281A and GR2287A Production Test System

Introduction to GR228X Test Systems

2-5

Standard System Hardware The standard system hardware configurations include: Hardware

GR2281A

GR2287A

ASM

ASM

11

30

1408

3840

Mux Ratio

2:8

2:8

Analog testing & measurement

Yes

Yes

Digital testing & measurement

No

No

Clock/Sync/Trigger board

No

No

High Speed Controller

No

No

Pin board type Pin board (max) Available nail (max)

NOTE

Data rates are used to describe digital test vector speeds. Since the GR2281A and GR2287A Production Test Systems do not have a digital subsystem, data rates are not available. ASM refers to Analog Scanner Modules

Optional Hardware The hardware options that can be added to the standard system configurations include: z Increasing the number of pin boards from minimum configurations GR2281A systems can contain up to 11 pin boards. The standard system comes with 4 pin boards. GR2287A systems can contain up to 30 pin boards. The standard system comes with 4 pin boards. z UUT power supplies in any combination of these voltages: Programmable Voltage (PS) (up to 5 PS in alliance rack)

Fixed Voltage (Fixed) (set of 3 )

0 - 7V @ 15A

+5V @ 6A

0 - 20V @ 8A

+15V @ 1.0A

+5V @ 6A or

+12V @ 1.3A

0 - 60V @ 2.5A z High Voltage DC Voltage Source (+120V) z Additional vacuum port (2281A only) z Bar Code Scanner z IEEE interface z Custom Function Board (CFB) with Frequency Time Interval Instrument (FTI) z Repair ticket printer or line printer

2-6

GR228X Test Systems

GR228X iĆSeries Test Systems The Production Test Systems are designed to provide comprehensive testing for small to large scale Printed Circuit Boards (PCB) and assemblies. Each Production Test System provides full analog and digital measurement capabilities for testing. Figure 2–3 shows a GR228X i–Series Test System. The GR228X i–Series Test Systems include the GR2283, GR2284, GR2286, GR2287, and GR2287L.

33006.0

Figure 2–3

Introduction to GR228X Test Systems

GR228X i–Series Test System

2-7

Standard Hardware The standard test system hardware configurations include: Hardware

GR2283

GR2284

GR2286

GR2287

GR2287L

GR2287LX

Pin board type

Combo I

Combo II

Combo I

Combo II

HDC1 or Combo II

HDC2

Pin board (max)

15

15

30

30

30

30

Driver/Sensors per board

16

32

16

32

32

64

Available nails (max)

1920

1920

3840

3840

7680

7680

Mux Ratio

2:16

2:8

2:16

2:8

2:16

2:8

Data Rate

5 MHz

5 MHz

5 MHz

5 MHz

5 MHz

5 MHz

Analog testing and measurement

YES

YES

YES

YES

YES

YES

Digital testing and measurement

YES

YES

YES

YES

YES

YES

Clock/Sync/Trigger board

YES

YES

YES

YES

YES

YES

High Speed Controller

YES

YES

YES

YES

YES

YES

NOTE

2-8

HDC refers to the High Density Card.

GR228X Test Systems

Optional Hardware The hardware options that can be added to the standard system configurations include: z Increasing the number of pin boards from the 2 pin board minimum configuration. GR2283 and GR2284 systems can contain up to 15 pin boards. In addition, there are 7 accessory slots available which can contain optional hardware modules such as DSM boards and the AFTM board. GR2286 and GR2287 systems can contain up to 30 boards including more pin boards and the optional DSM and/or the AFTM. Accessory slots are not available for these systems. The GR2287L must have a minimum of two High Density Cards (HDC1). Optionally, you can populate the GR2287L with up to 28 Combo II boards. The GR2287LX can only be configured with HDC2 pin boards. z UUT power supplies in any combination of these voltages: Programmable Voltage (PS) (up to 2 cages of 7 PS)

Fixed Voltage (Fixed) (set of 3 )

0 - 7V @ 15A

+5V @ 6A

0 - 20V @ 8A

+15V @ 1.0A

+5V @ 6A or

+12V @ 1.3A

0 - 60V @ 2.5A z High Voltage DC Voltage Source (+120V). DC Current Measure (+60mA). z IEEE-488 Interface Controller and Instrument Multiplexer z Deep Serial Memory Module (DSM) z Custom Function Board (CFB) with Vehicle Control Interface (VCI) or Frequency Time Interval Instrument (FTI) modules z Bar Code Scanner z Repair ticket printer, line printer z AFTM

Introduction to GR228X Test Systems

2-9

GR228X eĆSeries Test Systems The GR228X e-Series Test Systems are designed to provide comprehensive testing for small to large scale Printed Circuit Boards (PCB) and assemblies. Each GR228X e-Series Test System provides full analog and digital measurement capabilities for testing: z Analog, digital, and mixed signal components. z Functional blocks of components. z All types of components (including SMT) without using device libraries, if you purchase the TEST XPRESS option. Each e-Series system is compatible with all other e-Series systems that contain the same mux ratio. Test programs and fixtures developed on one system are easily migrated to another e-Series system. Figure 2–4 shows the GR228X e-Series Test System.

DVR/STROBE TRIGGER STROBE 1 TEST 3 STEP UUT VACUUM CONTROL FIXTURE AUTO MODE RAISE ENABL L AUTO SYSSNR/STROBE 2 CLOCK STROBE DIG4INSTR AUTO OFFSINGLE ON MODE ON R DUAL PROBE LOWER

POWER CPU ON OFF PROBE

42905.0

Figure 2–4

2-10

GR228X e–Series Test System

GR228X Test Systems

Standard System Hardware The six standard e-Series system configurations are described in the following table. The e-Series systems use one of two receivers: z GR2283e, GR2284e, and GR2285e systems use receiver connector positions 0 through 18. z GR2286e, GR2287e, and GR2289e systems use receiver connector positions 0 through 33. Hardware

GR2283e

GR2284e

GR2285e

GR2286e

GR2287e

GR2289e

Pin board type

Combo I

Combo II

XP

Combo I

Combo II

XP

Pin board (max)

15

15

15

30

30

30

Driver/Sensors per board

16

32

32

16

32

32

Available nails (max)

1920

1920

1920

3840

3840

3840

Mux Ratio

2:16

2:8

2:8

2:16

2:8

2:8

Data Rate

5 MHz

5 MHz

10 MHz

5 MHz

5 MHz

10 MHz

Analog testing and measurement

Yes

Yes

Yes

Yes

Yes

Yes

Digital testing and measurement

Yes

Yes

Yes

Yes

Yes

Yes

Clock/Sync/Trigger board

Yes

Yes

Yes

Yes

Yes

Yes

High Speed Controller

Yes

Yes

Yes

Yes

Yes

Yes

NOTE

XP means Xtended Performance.

Introduction to GR228X Test Systems

2-11

Optional Hardware The hardware options that may be added to the standard system configurations include: z Increasing the number of pin boards from minimum configurations GR2283, GR2284, and GR2285 systems can contain up to 15 pin boards. The standard system comes with 2 pin boards. GR2286, GR2287, and GR2289 systems can contain up to 30 pin boards. The standard system comes with 5 pin boards. z UUT power supplies in any combination of these voltages: Programmable Voltage (PS) (up to 14 PS in two alliance racks) 0 - 7V @ 15A 0 - 20V @ 8A 0 - 60V @ 2.5A

Fixed Voltage (Fixed) (set of 3 for ICA systems only) +5V @ 6A +15V @ .75A

z High Voltage DC Voltage Source (+120V). DC Current Measure (+60mA). z IEEE-488 Interface Controller and Instrument Multiplexer z Custom Function Board (CFB) with Vehicle Control Interface (VCI) or Frequency Time Interval Instrument (FTI) modules z Deep Serial Memory Module (DSM) z Analog Functional Test Module (AFTM) z Additional Relay Driver Board z Bar Code Scanner z Footswitch

2-12

GR228X Test Systems

GR2283 and GR2284 Test Systems The GR2283 and GR2284 Test Systems, which have evolved since their introduction in 1992 have one of these configurations. z a control arm and no shelf. z a control arm and shelf. z a monitor/control arm and shelf. Refer to Figure 2–5.

42874.0

Figure 2–5

GR2283/GR2284 Test System with a Monitor/Control Arm and Shelf

Introduction to GR228X Test Systems

2-13

Standard System Hardware The standard system hardware configurations include: Hardware

GR2283

GR2284

Pin board type

Combo I

Combo II

Pin board (max)

15

15

Driver/Sensors per board

16

32

Available nail (max)

1920

1920

Mux Ratio

2:16

2:8

Data Rate

5 MHz

5 MHz

Analog testing & measurement

Yes

Yes

Digital testing & measurement

Yes

Yes

Clock/Sync/Trigger board

Yes

Yes

High Speed Controller

Yes

Yes

Optional Hardware The hardware options that can be added to the standard system configurations include: z Increasing the number of pin boards from minimum configurations GR2283 and GR2284 systems can contain up to 15 pin boards. The standard system comes with 2 pin boards. z UUT power supplies. The Programmable Voltage (PS) supplies are: 0 - 7V @ 15A 0 - 20V @ 8A 0 - 60V @ 2.5A z IEEE-488 Interface Controller and Instrument Multiplexer z Deep Serial Memory Module (DSM) z Analog Functional Test Module (AFTM) z Additional Instrument Multiplexer Board z Additional Relay Driver Board z Custom Function Board (CFB) with Vehicle Control Interface (VCI) or Frequency Time Interval Instrument (FTI) modules z Bar Code Scanner z Footswitch z Repair ticket printer z Line printer z Load box (for operational verification)

2-14

GR228X Test Systems

GR228X Test Systems with Windows NT PC Retrofit Your VMS-based GR228X Test Systems can be upgraded using the Windows NT PC Retrofit option. GenRad no longer builds or develops new software features for the VMS-based test systems. The Windows NT PC Retrofit option enables you to run the latest release of the GR228X software and improves the throughput of your system. Figure 2–6, Figure 2–7, and Figure 2–8 shows the GR228X Test Systems with the Windows NT PC Retrofit installed.

ÉÉÉ ÉÉÉ 31854.0

Figure 2–6

PC Retrofitted GR2282 Test System

31853.0

Figure 2–7

PC Retrofitted GR2286 and GR2287 Test Systems

Introduction to GR228X Test Systems

2-15

32500.1

Figure 2–8

PC Retrofitted GR2288 Test System

Standard System Hardware The standard system hardware configurations include: Hardware

GR2282

GR2286

GR2287

GR2288

Pin board type

Combo I

Combo I

Combo II

Combo II

Pin board (max)

30

30

30

9

Driver/Sensors per board

16

16

32

32

Available nail (max)

3840

3840

3840

1152

Mux Ratio

2:16

2:16

2:8

2:8

Data Rate

5 MHz

5 MHz

5 MHz

5 MHz

Analog testing and measurement

Yes

Yes

Yes

Yes

Digital testing and measurement

Yes

Yes

Yes

Yes

Clock/Sync/Trigger board

Yes

Yes

Yes

Yes

High Speed Controller

Yes

Yes

Yes

Yes

NOTE

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The GR2282 is the only 4-wire system, the other systems are 8-wire.

GR228X Test Systems

Optional Hardware The hardware options that can be added to the standard system configurations include: z Increasing the number of pin boards from minimum configurations GR2282 systems can contain up to 30 pin boards. The standard system contains 5 pin boards. GR2286 and GR2287 systems can contain up to 30 pin boards. The standard system contains 5 pin boards. GR2288 systems can contain up to 9 pin boards. The standard system contains 2 pin boards. z UUT power supplies Universal Power Supply (UPS)

Programmable Voltage Supply (PVS)

Selectable Voltage Supply (SVS)

10V

0 - 5.5V @ 50A

7 - 20 - 20

20V

0 - 7V @ 35A

20 - 20 - 20

40V

0 - 30V @ 8A

50V z Load box (for UPS/SVS current verification tests on GR2288) z Additional Instrument Multiplexer Boards z Additional DC Voltage and Current Source Boards z Additional Relay Driver Board z Bar Code Scanner z IEEE interface z Line printer z Analog Instrument Option (AIO) z Analog Functional Test Module (AFTM) z Deep Serial Memory (DSM) z Custom Function Board (CFB) with Vehicle Control Interface (VCI) or Frequency Time Interval Instrument (FTI) modules z Expansion bay (GR2286 and GR2287) z Footswitch

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2-17

UUT Power Supplies The GR228X Test Systems can include optional UUT power supplies that provide power to the UUT. There are two types of UUT power supplies: z Programmable voltage power supplies (PS) z Fixed voltage power supplies (Fixed) The Windows NT-based GR228X system can support up to seven individual power supply modules in a controller box. The system’s configuration is established by both the number and types of power supply modules in the system and the wiring between receiver connections and the power supply modules. Virtual power supplies are created by wiring power supply modules in parallel, in series, or a combination of parallel and series. You designate the virtual power supplies as PS(n); thus, a PS power supply can be composed of any possible combination of power supply modules. A virtual supply is mainly used to stack power supplies to obtain higher voltages or currents than are available from individual power supply modules. Power supply modules and their connections must be described in the UUT power supply configuration file. This file maps the virtual unit numbers, such as PS(3), to the actual power supply modules. You need to know your system configuration in order to program the test statements that control the available UUT power supplies. Your system’s UUT power supply configuration also affects test fixture wiring. Use the SETUP monitor page to determine your system’s UUT power supply configuration. For more information about using the SETUP monitor page, refer to Chapter 8 of the GR228X Test Program Generation Manual. PC Retrofitted test systems have different power supplies than the Windows NT-based systems. For more information about your power supply options, refer to Chapter 10 of the GR228X Test Program Generation Manual.

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GR228X Test Systems

Available UUT Power Supplies Choosing optional UUT power supplies depends on your GR228X system type and its configuration. Table 2–2 identifies which UUT power supplies are available for your Windows NT-based GR228X system. Table 2–2 Available Power Supplies for GR228X Systems System Type

Fixed Power Supply (Fixed)

Programmable Power Supply (PS)

GR2280

YES

YES

GR2281

YES

YES

GR2281A

YES

YES

GR2282

YES

NO 

GR2283

YES


YES

GR2284

YES


YES

GR2285

YES


YES

GR2286

YES


YES 
NO 

GR2287

YES


YES 
NO 

GR2287L

YES

YES

GR2287LX

YES

YES

GR2287A

YES

YES

GR2288

YES

NO 

GR2289

YES


YES




e–Series ICA systems permit the use of a User (Fixed) power supply.



Non-ICA GR2286e and GR2287 e–Series systems can only use PS power supplies.



Windows NT PC Retrofit systems cannot contain Programmable power supplies (PS).

Introduction to GR228X Test Systems

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Optional Programmable Voltage UUT Power Supplies The programmable voltage UUT power supplies are optional on the UNIX-based systems. Three types of PS supplies are available: z 0 - 7 V, 15 A z 0 - 20 V, 8 A z 0 - 60 V, 2.5 A NOTE

These power supplies can be connected in series or parallel to increase the voltage and current.

Each Windows NT-based GR228X UUT power supply complement is configured at GenRad according to the test system’s needs. Often, the configuration is based on existing GR227X and GR228X systems at your facility, so that you can easily move test sets and associated fixtures to the other GR228X systems.

Optional Fixed Voltage Power Supplies User (Fixed) power supplies are available on e–Series systems configured with the ICA module. UNIX–based GR228X systems that do not include an ICA module, use PS 11, PS 12, and PS 13 to emulate the User (Fixed) power supplies. Two types of fixed power supplies are available: z +5 V, 6 A z +15 V, 0.75 A For i–Series systems, two types of fixed power supplies are available: z +5 V, 6 A z +12 V, 1.3 A

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GR228X Test Systems

GR228X Test Software

3

The GR228X Test System family is designed primarily to execute in–circuit tests on electrically isolated components of a unit–under–test (UUT). Such components include analog, digital, and hybrid ICs. The GR228X Test System can z Detect manufacturing faults, such as wrong , missing, damaged, and incorrectly inserted components, and damaged etches. z Detect connectivity faults on bare boards. z Run functional tests on complete circuits on the systems that contain the instruments needed to perform the test. The GR228X test program preparation and Run-Time System (RTS) software comprise the GR228X software, which is an application layered on Windows NT. The GR228X monitor and Software Control area form the interface to the GR228X UNIX software which enables you to develop test programs, manipulate files, and test boards. You can simultaneously perform more than one task by running multiple GR228X sessions from different directories. For example, you can run two program preparation sessions at the same time. NOTE

The Automatic Test Generator (ATG) features that provide testing for digital components are not available on the GR2281A and GR2287A Test Systems.

This chapter briefly describes the test development process and the numerous software tools that assist you in developing tests for isolating faults on the UUT. The tools are grouped into these categories: z Test Preparation z Test Generation z Test Debug z Test Execution z Test Analysis z Off-line Programming This chapter also describes migrating from one test system to another.

Introduction to GR228X Test Systems

3-1

Test Development Process A unique test program and test fixture, called a test set, must be developed for each type of board to be tested. The test program contains many individual in-circuit component tests. These tests are usually created by the system’s Automatic Test Generator (ATG) software, which is part of the test system’s program preparation software. The information required to develop a test set is presented in several manuals included in the GR228X Documentation Set. Figure 3–1 identifies the manuals that provide information on a particular phase of the test set development process. The GR228X Test Language Reference Manual and the GR228X Test Library Programming Manual are reference manuals for customizing or developing tests not generated by ATG. For a complete list of the documentation available for your GR228X Test System, refer to the GR228X Master Index. Manual Used

Test Development Phase

Manual Used

Gather Information, then Analyze Testing Requirements

CB/Test Documentation

Process CAD Data Using CB/Test

Manually Create Circuit Description (CKT)

Generate Test Program (ATG)

GR228X Test Program Generation Manual

Use Nail Assignment to Assign Nails; Generate Fixture Reports

Compile Fixture Data and Send to Fixture Manufacturer

Receive Test Fixture and Verify

Test Fixture Manual

Translate Test Program

GR228X Test Program Generation Manual

Debug Test Program

GR228X Test Program Debug Manual

Update Test Program

GR228X Test Program Debug Manual

Document Test Program

Release to Production

Figure 3–1

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GR228X Production Test User’s Guide

Test Development Process and Associated Manuals

GR228X Test Software

Test Preparation Tools The test preparation tools enable you to provide detailed data about the UUT devices and power requirements. These tools include the: z CBTest z Circuit Description Generator z System Device Libraries z Model Generation z Power Supply Editor

CB/Test CB/Test is part of the GR228X software running on Windows NT. It converts a GenCAD (general CAD output) file into a printed circuit board (PCB) database. The GenCAD file contains the major physical attributes of the board, such as the component shapes and position, pin X-Y locations, electrical net list, component types and electrical attributes, pad and via styles, board outline, and placement side of the device. It is created from a raw CAD data file using an input processor. There are a number of input processors available for different types of CAD systems. When the PCB database is created, you can: z View and interrogate the database using an interactive graphics editor z Compare the database against a system-level parts library verify if part attributes in the database are correct z Add missing parts to the parts library z Change pin names in the PCB database z Select the type of nodes to use in your circuit description file z View the board placed over the receiver shelf so that you can manually edit the probe placements

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3-3

Circuit Description Generator The Circuit Description Generator (CKTGEN) enables the test engineer to create and maintain a circuit description file (.ckt). CKTGEN prompts you for information about the board you want to test and the circuit device interconnections and characteristics. For each device type specified, such as a resistor, a template displays to prompt you for the device data. For detailed information on using CKTGEN, refer to the GR228X Test Program Generation Manual.

System Device Libraries Your GR228X system software includes a library toolset that has an object oriented graphical user interface. Use it to select and create digital, analog, hybrid component, and Boundary Scan (BSDL) models. You access the Library Toolset from the Start menu or by clicking its icon from the GR228X Program Launcher or the Start menu. You can use the library to: z Show all the existing primes in a library, as well as all aliases and packages associated with a prime. z Perform direct actions on this information, such as create, edit, view, move, rename, copy, export, add alias, add package, and delete. The device test libraries provide storage and access to generalized test procedures, also known as models, for individual devices. The device libraries available for your system include: z Digital Test Library (DTL) z Analog Component Library (ACL) z Hybrid Test Library (HTL) z Boundary Scan Library (BSL) z Analog Test Library (ATL)

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GR228X Test Software

Digital Test Library The digital test library (DTL) provides storage and access to generalized test procedures, also known as models, for individual digital devices. Figure 3–2 shows the Digital Test Library window.

Figure 3–2

Digital Test Library Window

The Digital Test Generation (DTG) software uses entries from Digital Test Library (DTL) files to produce tests for digital components on a given UUT. The Digital Test Library contains individual component models written in the Digital Test Source Language (DTSL). The Digital Test Generator (DTG) uses the circuit description file and DTL models to identify and extract a generalized device test that is tailored to the specific digital device circuit configuration. The specific digital device model provides DTG with routines to: z Test the device in most wiring configurations z Inhibit and disable the device while testing other components z Test any bused outputs, functional blocks, and banks Refer to the GR228X Test Library Programming Manual for more detailed information.

Introduction to GR228X Test Systems

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Hybrid Test Library The Hybrid Test Library (HTL) provides storage and access to generalized test procedures, also known as models, for individual hybrid devices. Examples of complex mixed signal parts that the hybrid test library can include; Analog to Digital Converters, Digital to Analog Converters, and operational amplifiers. Figure 3–3 shows the Hybrid Test Library window.

Figure 3–3

Hybrid Test Library Window

Refer to the GR228X Test Library Programming Manual for more detailed information.

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GR228X Test Software

Analog Component Library Analog Component Library (ACL) contains a description of complex analog parts so that ATG knows the characteristics of each analog component inside the complex analog part and can write a simple test for each one. Examples of complex analog parts that the analog component library can describe include Resistor packs and Op Amps. The library toolset can automatically create ACL models for common analog parts, such as resistor packs. Figure 3–4 shows the Analog Component Library window.

Figure 3–4

Analog Component Library Window

Refer to the GR228X Test Library Programming Manual for more detailed information.

Introduction to GR228X Test Systems

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Boundary Scan BSDL Models A Boundary Scan Library (BSL) enables you to create and manage libraries of Boundary Scan Description Language (BSDL) models. Figure 3–5 shows the Boundary Scan library window. The BSDL library utilities enable you to: z Create Boundary Scan Libraries z Verify the syntax of the BSDL models z Add, move, and modify BSDL models z Add and remove alias or package, or prime BSDL models

Figure 3–5

Boundary Scan Library Window

Refer to the GR228X Test Program Generation Manual for detailed information.

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GR228X Test Software

Model Generation The model generation tools enable you to develop models for devices on the UUT that do not have models available in the device libraries. The available model generation tools include: z Hybrid Model Editor z BasicSCAN (Bscan) z Xpress Model z Onboard Programming Tools

Hybrid Model Editor Hybrid Model Editor is an interactive graphical tool that you can use to create a model for a hybrid device. You can use any of the system’s test instrumentation to construct the test you require. Similar to analog and digital test models, hybrid models can use .CKT file flagspecs. A model has the facilities to use information in the .CKT file and .ATO file in generating a test. You access the Hybrid Model Editor from the Start menu or by clicking its icon from the GR228X Program Launcher. The Hybrid Model Editor is designed to facilitate data entry by providing a window that contains data entry fields. Figure 3–6 shows the Hybrid Model Editor main window.

Figure 3–6

Introduction to GR228X Test Systems

Hybrid Model Editor Main Window

3-9

BasicSCAN BasicSCAN is a separately licensed software product that is designed to solve the test generation problem for both Application-Specific ICs (ASICs) and complex commercial boundary scan components. You access BasicSCAN from the Start menu or by clicking its icon from the GR228X Program Launcher. BasicSCAN eliminates the need to develop test vectors for BasicSCAN components and has these benefits: z Simplifies the program preparation and debug processes. z Improves open pin fault coverage. z Reduces test development time. z Simplifies test complexity and reduces the number of test vectors. Figure 3–7 shows the BasicSCAN main window.

Figure 3–7

BasicSCAN Main Window

Once BasicSCAN knows the boundary scan capabilities of a component, it can automatically generate a Digital Test Source (.DTS) model that can be used by the test generation software. All BasicSCAN generated models use the same test structure. They are capable of generating disable and inhibit sections that describe how to prevent the device from interfering with other UUT component tests, and can also handle various component wiring configurations. When selected, BasicSCAN can also generate a test to run a component’s built–in self test.

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GR228X Test Software

The BasicSCAN test checks: z Component’s instruction register capture value. An incorrect capture value can indicate a faulty or wrong component. z Correct length of the Instruction Register and Boundary Scan Register. z IDCODE and USERCODE expect values are correct. z Opens between the system Driver/Sensor nails and the component’s input/output cells. This type of failure can indicate a mis–inserted or poorly attached component. z Component pins can either capture or drive both a logic 0 and a logic 1. This detects any stuck–at failures at the component’s input/output buffers. For more information about BasicSCAN, refer to the BasicSCAN Boundary Scan User’s Guide.

Xpress Model Xpress Model is an interactive graphical tool that you can use to create a model for a digital device that is not in the Digital Test Library. Xpress Model is often used to create models for custom digital components that do not support boundary scan components, such as programmable array logic devices (PALs). You access Xpress Model from the Start menu or by clicking its icon from the GR228X Program Launcher. Xpress Model is designed to facilitate data entry by providing a window that contains data entry fields. Figure 3–8 shows the Xpress Model main window. There are several 3rd-party software products that you can use to create DTL models. FS-ATG and AccuGEN are two products that can automatically generate models for PALs. For more detailed information on generating digital models, refer to the Xpress Model User’s Guide.

Figure 3–8

Introduction to GR228X Test Systems

Xpress Model Main Window

3-11

Onboard Programming Tools Onboard programming provides a cost–effective method for testing board assemblies. It enables you to program memory and in-system programmable (ISP) devices after they are assembled on a printed circuit board. This reduces manufacturing costs and improves product quality. Only unprogrammed devices need be in stock, reducing inventory. Programming Flash and ISP devices after board assembly reduces manufacturing time and costs. Because using onboard programming means the devices are handled less, fewer defects are introduced and product quality is improved. Programming the devices at board assembly time ensures the devices are programmed with the latest firmware. Onboard programming does require a longer test time in the manufacturing process; throughput is lower during the programming process. Flash memory is programmed using all device pins and requires full access. These devices use unique models that are created using published algorithm information produced by the vendor. ISP logic has dedicated pins for programming a fuse matrix; this requires access to 5–6 device pins. Programming models for these devices are automatically created using input from device vendor-supplied tools. Assemblies using these devices must be designed for testability because of the increased test time. Your design must isolate pins from other components that could adversely affect the programming. Onboard programming supports several vendor formats. For Flash devices, programming data is generic and is usually specified in one of the following file formats: z Intel Hex–32 bit z Motorola S–Record 32–bit z Absolute Binary z ASCII–Hex For ISP devices, the supported vendors and tools are: Vendors

Vendor URL

Tool

Altera

www.altera.com

MAX+PLUS II

AMD

www.amd.com

MACHPRO

Lattice

www.latticesemi.com

ispDCD

Xilinx

www.xilinx.com

EZTag

To obtain ISP vendor tools, you can contact your vendor sales representative or access the vendor home page at the specified URL. NOTE

Vendor tool names may change. There may be a vendor charge associated with these tools.

Deep Serial Memory (DSM) is specifically designed for onboard programming test applications. DSM reduces testing and programming preparation time, and required disk space. Programming Flash devices requires DSM. ISP devices can be programmed with or without DSM.

3-12

GR228X Test Software

When you use DSM, data is loaded into memory once, independently of the driver/sensor memory, and is separated from the test preparation process. If the data changes from device to device but the device configuration remains the same, the test preparation process does not need to be rerun. The data representation is more compact than what is used in the programming language, which reduces the required disk space. However, the bursts that result when you use DSM are very large. If the configuration changes when you use DSM, the preparation process must begin again. The Onboard Programming Solutions tools implement onboard programming of Flash and ISP devices using a graphical interface. Flash memory devices are non–volatile storage devices that allow memory writes and reads while the devices are assembled on the board. The Flash tool, which is shown in Figure 3–9, simplifies programming your Flash devices.

Figure 3–9

Introduction to GR228X Test Systems

Flash Tool Main Window

3-13

In–system programmable (ISP) devices are logic devices that can be electronically erased and reprogrammed after they are installed on a board. Because programming these devices requires that power be applied to the board, the board should be checked for shorts and other defects that could cause damage when power is applied. The ISP tool shown in Figure 3–10, in conjunction with a vendor tool, simplifies the process of programming ISP devices.

Figure 3–10

3-14

ISP Tool Main Window

GR228X Test Software

Power Supply Editor You use the Power Supply Editor to describe UUT power supply requirements for testing the UUT. You access the Power Supply Editor from the Start menu or by clicking its icon from the GR228X Program Launcher. Figure 3–11 shows the Power Supply Editor main window. You can also access the Power Supply Editor from the TestFlo interface or from the GR228X POWER monitor page interface. The Power Supply Editor can generate the: z GR228X test programming statements to power up, power down, and discharge the UUT power nodes. z Fixture Wiring Instructions (.fwi) file, which contains informational messages and instructions to the fixture assembler on how to wire the power supplies in the test fixture. z Power Test Program (.ptp), which is a stand–alone program that can be translated and run to verify that the fixture has been wired correctly and that the proper voltages are being applied to the UUT. You can also choose to automatically merge the .ptp file with the output of the test generators to produce a stand-alone test program. z Automatic Test Options (.ato or .atx) file which is input to the Automatic Test Generator (ATG). It can also contain power supply statements that are automatically included in the Test Program file (.tpg or .tpx). For a detailed discussion of the Power Supply Editor, refer to the online help topics.

Figure 3–11

Introduction to GR228X Test Systems

Power Supply Editor Main Window

3-15

Test Generation Tools The test generation tools enable you to generate the test program that identifies UUT device faults. These tools include the: z Automatic Test Generator z Preprocessor z Scan Pathfinder z Nail Assignment z Translator

Automatic Test Generator The Automatic Test Generator (ATG) uses the circuit description file (.ckt) and the library files (.atl, .acl, .dtl, .htl, and .bsl) to generate the test program automatically for each device on the printed–circuit board (PCB), otherwise called the Unit-Under-Test (UUT). Generating a test program is a multiple step process that you control using the ATG options shown in Figure 3–12. For detailed information on using ATG to generate your test program, refer to the GR228X Test Program Generation Manual.

Figure 3–12

ATG Monitor Page

ATG may not be able to generate tests for certain component types or device configurations not contained in the library. There may also be configurations in which ATG detects a potential for component damage or excessive error if an attempt is made to test a particular component. In these circumstances, ATG will not generate a test. You can however develop a test for that component using the test language. For detailed information about the test language refer to the GR228X Test Language Reference Manual.

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GR228X Test Software

Preprocessor The preprocessor is a general purpose interpreter program that converts flagged statements in a file to GR228X test programming statements that the translator understands. The preprocessor simplifies complex programming sequences, eliminating the need for creating tests for specific components. The preprocessor contains three interpreter programs (.IEE) files: system, update, and user. For more information on using the Preprocessor, refer to the GR228X Test Program Generation Manual.

Scan Pathfinder The Scan Pathfinder software is a separately licensed option that can generate boundary scan test programs for UUT scan chains that are IEEE 1149.1–1990 boundary scan compliant. This option comes integrated with the GR228X software You access Scan Pathfinder from the Start menu or by clicking its icon from the GR228X Program Launcher. Figure 3–13 shows the Scan Pathfinder main window.

Figure 3–13

Introduction to GR228X Test Systems

Scan Pathfinder Main Window

3-17

The Scan Pathfinder software: z Performs full–access opens testing of individual ICs as well as more complex interaction and interconnect testing of limited–access, mixed boundary scan boards. z Verifies the syntax and structure of Boundary Scan Description Language (BSDL) models. It also verifies the IDCODE, USERCODE, and RUNBIST instructions. z Integrates the boundary scan test generator with the Automatic Test Generator (ATG), and provides a separate boundary scan diagnostic generator that communicates with the Run–Time System (RTS) software. z Contains a graphical user interface that you use to select boundary scan tests and options. z Generates boundary scan reports that provide details about the UUT boundary scan configuration, generated tests, fault coverage, and nodes where access is not required. z Contains automatic adaptive pattern test generation to resolve ambiguous short faults and to produce accurate pin–level diagnostics. z Contains a boundary scan debug mode to help identify test problems. z Contains a boundary scan library with BSDL models for a number of commercially available Boundary Scan parts. Scan Pathfinder generates boundary scan test programs that can detect these UUT interconnect faults: z Test Access Port (TAP) pin stuck–at failures. z Faulty scan paths through the UUT’s Instruction, Bypass, or Boundary Scan Registers. z Incorrect IDCODE or USERCODE values in Boundary Scan parts. z Opens at nailed UUT Boundary Scan pins. z Boundary Scan parts that fail their built-in self-test. z Shorts between nailed conventional nodes and un–nailed Boundary Scan nodes. z Shorts and opens between un–nailed Boundary Scan nodes. For more information regarding modeling and testing of boundary scan components, refer to the GR228X Scan Pathfinder User’s Guide.

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GR228X Test Software

Nail Assignment The nail assignment tool automatically assigns all test nails and produces fixture wiring reports. It supports SHORT_WIRE nail assignment, which is used to build short–wire fixtures. It also supports new fixture development as well as modifications to an existing fixture resulting from an ECO. The NAIL_ASSIGNMENT monitor page produces the report files used to build a fixture. Use NAIL_ASSIGNMENT to: z Obtain an accurate fixture wiring list. z Obtain a cross-reference of the assigned nail, node name, and nail interconnection. This data is useful during fixture debug and test program debug. z Modify diagnostic files to improve the failure report data. z Modify a test set to reflect changes as the result of an ECO. NAIL_ASSIGNMENT also offers panel test and Opens Xpress capabilities. For more detailed information, refer to the GR228X Test Program Generation Manual.

Translator The Translator uses a source test program (.tpg) file as its input and produces an object file (.obc ) file as its output. The .OBC file is a compact binary file that the tester uses to test UUTs. The Translator: z Locates and reports program format and syntax errors. z Creates an error list (.lis) file. z Checks the language structure, syntax, and nail multiplexing for conflicts as the statements are translated. z Reports error messages which include the statement where the error was recognized. A caret is inserted under the point of error recognition. The location and type of error are also listed below the statement. NOTE

Each .tpg must be translated for the target tester on which it will run. Therefore, if you have more that one GR228X Test System, you must have an .obc file for each test system that will run the test program.

For more detailed information, refer to the GR228X Test Program Generation Manual.

Introduction to GR228X Test Systems

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Test Debug Tools The GR228X system has easy to use debugging tools that can decrease the time you spend debugging your test programs. These tools include: z Program Xplorer z Autodebug z Digital Waveform Display z Measuring Fault Coverage (ALLFAULT) z Floating Point Array Display All the debugging tools are described in detail in the GR228X Test Program Debug Manual.

Program Xplorer The Program Xplorer is a graphical debugging tool for analog tests within the GR228X test program. Before using the Program Xplorer, you should: z Run ATG and nail assignment z Build and debug the test fixture z Obtain one or more UUTs that you can use for debugging the test program and fixture The Program Xplorer display, shown in Figure 3–14, provides a window environment that enables you to: z Modify GR228X instrument statements z Determine which nodes surround the Device Under Test (DUT) z Plot measurement readings z View graphical views of mux connections The Program Xplorer relies on information stored in the .idd and the .wor files, both of which are created from the .ckt file. For detailed information on debugging with Program Xplorer, refer to the GR228X Test Program Debug Manual.

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GR228X Test Software

Figure 3–14

Program Xplorer

Autodebug Autodebug is a debugging tool that uses the Run-Time System (RTS) to debug your test program without programmer interaction. Autodebug performs the actions that you would interactively perform using RTS’s Debug mode. Autodebug assumes that the test program, not the UUT or fixture, is the cause for a test that does not pass. You can edit the Autodebug command file (.ADC) to control which debug changes are performed. When you debug a test program using Autodebug, it recognizes the type of test and applies a sequence of debug commands that attempt to pass the test. The tasks Autodebug can perform on analog tests include: z Changing the values of analog test parameters z Swapping source and measure z Adding a small delay to adjust the guard set z Modifying instrument parameters For digital tests that fail or have unknown output states, Autodebug can: z Initiate the learning of output states z Insert faults using the Digital Fault Insertion (DFI) feature Most of the debug actions that Autodebug initiates require data contained in the in-circuit diagnostic data file (.idd). Although an Autodebug session can be performed without an .idd, useful results generally occur only when an .idd file is supplied. For detailed information on debugging analog tests with Autodebug, refer to the GR228X Test Program Debug Manual.

Introduction to GR228X Test Systems

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Digital Waveform Display When you test a digital component using the DIAGNOSE monitor page set to Debug mode, a waveform display of the driven and sensed logic states displays as shown in Figure 3–15. You can view digital debug information by using: z Test statement z Digital waveform The test system also offers unique debugging features for bursts that contain CRC collection and indirect addressing statements.

Figure 3–15

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UNTRANSLATE Display and Waveform Display

GR228X Test Software

Waveform Display Capabilities Interpreting data in an array often depends on the ability to display a waveform or part of a waveform and to quickly find what you are looking for. These are the system’s waveform plotting capabilities. Capability

Description

Multiple windows

Enables you to display up to 20 plot windows at a time. Each window has a unique title.

X–Y Coordinates

Uses crosshairs to read X–Y coordinates.

Multiple waveforms in a single window

Enables you to add waveforms to an existing window, delete waveforms, lock waveforms, and hide waveforms.

Window size

Enables you to change the Plot window size.

Waveform attributes

Enables you to select a waveform, change its color, point size and shape, and the type of lines it uses to connect points.

Selecting the amount of data to plot

Enables you to plot an entire array or a portion of an array (subarray).

Saving, loading, and printing

Enables you to save data from a plot window for a future display. You can load previously saved plot data or print a plot.

Magnification

Enables you to focus (zoom) on a particular portion of the window.

Log10 mode

Enables you to convert the display to log10 mode.

Scrolling

Enables you to scroll (shift) the waveform display left, right, up, and down.

Help

Provides on–line help for the plot window.

The PLOT system subroutine and the debug PLOT command only display the values at the time the plot was made.

Introduction to GR228X Test Systems

3-23

Measuring Fault Coverage (ALLFAULT) The GR228X software provides test techniques to handle the many types of components used on printed–circuit boards. ALLFAULT is a Run-Time Debug command that analyzes your test program and generates a report indicating how effective the test is at detecting potential faults. The ALLFAULT generated report can provide: z Digital Fault Insertion results for all digital components that are tested within a burst. It also flags device pins that can not detect open and stuck pin faults. z Results for all test program BUSTEST and FORCE sections. It flags BUSTESTS that fail and identifies disable and FORCE sections that have incorrect current measurements. z A test summary for each component tested using analog instruments. This data is derived from running the analog component tests many times, then reporting the min, max, and standard deviation of the collected measurements. The flags for this test can indicate when a test failed, is measuring too close to a measurement limit, or is unstable from test to test. z UUT Fault Coverage Summary section that identifies: Board summary of digital fault insertion results Digital Bursts that failed and had no fault inserted Digital Bursts that had faults inserted, but failed during reruns UUT components tested using the Opens Xpress technique Bustest statistics information Analog tests that contain problems which should be debugged UUT components that are not tested using any technique Nodes that are missing from the shorts and contact tests The ALLFAULT Test Coverage Report can be used by several different departments to improve production and product quality. z The Test Engineer can use the report to identify tests that may need more debugging, or identify components that are missing tests, and can be used to document the test program for other departments. z The Manufacturer or Customer receiving the test program can use the ALLFAULT General Summary section at the end of the report to determine the fault coverage provided by the in–circuit test program. The report identifies components that may require additional testing after in–circuit test. Functional tests or system self tests can be created for areas of the board that are not fully tested during in–circuit testing. z The Repair Technician can use the ALLFAULT General Summary to help troubleshoot difficult–to–repair boards. The report lists the type of test used, any problems with the test, and any untested components. NOTE

The ALLFAULT command uses the ATG internal work (.wor) and the in-circuit diagnostic data (.idd) files to obtain circuit connection and component information.

The test information for each component will vary depending on the test technique used. For detailed information on using ALLFAULT, refer to the GR228X Test Program Debug Manual.

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GR228X Test Software

Floating Point Array Display There are two ways to plot an array or a subarray. You can use the PLOT system subroutine within a test program to automatically plot waveforms, or you can use the PLOT debug command while stepping through a test program. Test programs can use arrays of data that can contain up to 65535 floating–point numbers. A test program can use arrays, for example, as a multi–tone signal input to the Arbitrary Waveform Generator (AWG). The output of a DUT can be sampled with the Digital Multimeter (DMM) and saved into an array for examination; this is called digital signal processing (DSP). Common applications using waveforms include measuring gain, frequency response, and settling time. One way of examining an array’s data is to plot its contents. The plot provides a visual representation that confirms the data and displays trends. You typically plot arrays during the debug phase of test program development. In both cases, the plot displays in a plot window. There can be more than one array plot window during a session, and each window’s graph can include multiple array plots. The GR228X software permits you to manipulate the views. You can issue a PLOT command from the debug prompt to send a plot to a plot window created by a CALL PLOT system subroutine. Similarly, by specifying a particular plot window name in a CALL PLOT system subroutine, you can send a plot to a plot window that you created in debug mode. Refer to GR228X Advanced Applications for information about the use of arrays when converting between the time and frequency domains.

Introduction to GR228X Test Systems

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Array Plot Window Figure 3–16 shows the main parts of a plot window.

Figure 3–16

Plot Window

The plot window has a menu bar that permits you to perform activities such as saving and printing a waveform, altering the view of a waveform, and obtaining online help. You can operate on the entire display, for example, using features such as scrolling and resizing. You can select an individual waveform within a plot by changing its attributes (color, dot size and shape, line thickness) or hide it from view. You can customize the plot window to include multiple waveforms. You can select an individual waveform and alter its attributes to distinguish it from other waveforms. To focus on particular data, you can change the view by zooming and scrolling the plot. You can update the display, while keeping portions and removing other portions. The plots provide you the capability to manipulate the display to help you interpret the data.

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GR228X Test Software

Generating a Plot You can generate a plot during test program debug using either a system subroutine call from within the test program or by stepping through the test program and running the PLOT debug command. The two methods are interchangeable and yield the same display. The result is a graph of an array in a window. Both methods permit you to select the amount of data, the plot window to which it is displayed, and whether to retain previously generated plots in a selected window.

Test Execution Tools The GR228X system test execution software includes: z Standard test software z PinPoint Guided Probe z Panel Test, Split Fixturing, and Serial Numbering z TEST XPRESS

Standard Test Software Production testing is performed using the DIAGNOSE Monitor page in Test mode. Test mode executes the test program and provides comprehensive diagnostic messages to the operator, identifying failing components. The diagnostic data can be tailored to the application The standard test software includes these diagnostic techniques: z Limited or unlimited access mode z BUSTEST z Softprobe z Scratchprobe

Limited or Unlimited Access Mode A privileged user can set the access mode. Automated testing can be set up using a batch process that allows options to be set without operator intervention. Limited access mode allows you to limit operator access to testing. This means the operator can only test the UUT, use Scratchprobe, obtain test diagnostics, and log test data. Unlimited access mode allows full use of the DIAGNOSE page which includes access to all the debugging options and all the other monitor pages. Refer to the GR228X Test Program Generation Manual for more information about access modes.

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BUSTEST The BUSBUST test technique is used to detect and diagnose device defects on bus nodes. The BUSBUST Diagnostic Routine can isolate a BUS node defect to the device output pin that is causing the GO/NOGO test to fail. A test program can contain many BUSTEST sections which include two tests that are performed in this order. z The GO/NOGO test verifies that the bus nodes can be disabled by placing all the device outputs connected to the bus nodes in a high–Z state. The bus nodes are pulled high and then pulled low to verify that all the devices can be disabled from the bus. If the GO/NOGO test: Passes, the devices can be BURST tested later in the program. Fails, the devices are marked as UNTESTABLE. z Measure the device output driver currents using a force high and force low test for each device output connected to the bus. The forces must be properly written to allow accurate diagnosis, should the GO/NOGO test fail.

SoftProbe SoftProbe is a diagnostic technique that can identify multiple open or stuck input and output pins on a wide variety of digital ICs using normal in–circuit test vectors. SoftProbe test procedures use Digital Fault Insertion to verify the fault coverage and build a knowledge database. The most accurate diagnostic messages are the result of high fault coverage of the test vectors. SoftProbe detects open pins by first recording the failing component signature, then successively rerunning the component test while simulating open input failures. After each run of the test, the new failing output signature is compared to the original signature. If a difference exists between the two signatures, the pin is not open. If there is no difference between the two signatures, the pin is open. While the diagnostic data is being collected, it is constantly compared to the digital component knowledge database to eliminate false diagnostics.

ScratchProbe ScratchProbe is a diagnostic technique used after all the digital ICs are individually tested. This second level digital diagnostic tests each IC that failed. This technique uses a hand-held probe to assist in determining whether a fault is caused by a bad IC, open connecting circuitry, or a ‘bad nail.’ Scratchprobe can be invoked by the user, the diagnostics, or the test program. To verify connectivity between a suspect IC pin and a system driver, you lightly scratch the probe continuously along the length of the side of the IC. If continuity is found, the IC is bad. If no continuity is found, you can choose to probe other pins on the node. When you select the full monitor option, continuity is tested between the suspect device and the suspect nail on the node. If continuity to some of the devices on the node is discovered, an open track exists. If no continuity is found, the nail contact is bad or the IC pin is bent.

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GR228X Test Software

PinPoint Guided Probe The PinPoint Guided Probe enables you to develop test programs that execute an arbitrary number of functional block tests (bursts) on functionally or topologically partitioned UUTs. The PinPoint Guided Probe feature consists of various software modules within the GR228X Program Preparation and Run–Time software. The feature prompts the test operator to probe the nodes that logically influence the faulty node. Once the source of the failure is determined, the operator can print a report detailing the problem, place it with the PCB, then test the next PCB. A mechanism is required to develop source files for functional block tests for use by the GR228X Program Preparation software. While these files can be developed manually, it is often necessary to use a simulator to model the functions they are based upon. Probing is an interactive process between the operator and the system that aids in the diagnosis of a failing UUT. Guided probe operation requires that the system have a database that contains the circuit description of the UUT and fault free probe values for every node. The guided probe process uses this information to find the failing node. Refer to the PinPoint Guided Probe User’s Guide for detailed information.

TEST XPRESS TEST XPRESS is a suite of tests that identify open circuits (such as solder opens) and/or improperly oriented components. These options are separately licensed: z Junction Xpress z Opens Xpress z Cap Xpress z Orient Xpress NOTE

TEST XPRESS is not available for GR2288 test systems.

The TEST XPRESS options require these elements: z Test Instruments You need a stable ac source and flexible sensitive sampling ac voltmeter which is supplied by systems containing an ICA module, an AFTM module, or ATM, AMM, and APM modules. The ACZ device used by systems with a measure cage is not sensitive enough to use with the TEST XPRESS options. z A path connecting the DUT to the test instruments The TEST XPRESS options used for establishing the path depend on the option selected. Option

How connected

Junction Xpress

Applies an AC voltage with DC bias to pins on IC that have a diode path to ground. Does not require special fixturing hardware.

Opens Xpress, Cap Xpress, and Orient Xpress

Places an opens probe above the DUT to capacitively couple pins on the DUT to the sampling voltmeter. Requires a special overclamp fixture.

Introduction to GR228X Test Systems

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z Access to the pins of the DUT The UUT in-circuit test fixture provides the required access to the pins of the DUT. You will need to create a Device Probe Information (.dpi) file along with the .ckt file when generating the Device Probe Report (.dpr) for the fixture vendor. For detailed information on using the TEST XPRESS options, refer to the TEST XPRESS User’s Guide.

Junction Xpress This option is a licensed feature that generates tests that identify open pins on ICs. No special fixture wiring is required to use Junction Xpress. Junction Xpress testing is recommended for testing: z Ceramic or shielded device packages, or devices with heat sinks. z Devices that have a high pin count. z Marginal solder joints. z Devices that do not have device models available. z Devices that would add considerable cost because they require special fixture hardware.

Junction Xpress Predictor This tool helps the test programmer decide whether to test a particular component using Junction Xpress or Opens Xpress. The tool examines the circuit description contained in the .idd file and makes a prediction regarding the testability of each pin on a component. The accuracy of the prediction for each pin is limited because it is based on an analysis of the circuit description and not on actual electrical measurements, as is done by the TEST XPRESS POLEARN command. However, the assessment of the testability of the component itself will usually be accurate.

Opens Xpress This is a licensed option that generates tests that identify opens on connectors, sockets, and ICs. To use Opens Xpress, special hardware must be added to the test fixture. Opens Xpress testing is recommended for testing: z Non–semiconductor devices. z Analog and mixed–signal devices. z Whether the fixture is properly contacting the UUT.

Cap Xpress This option generates tests that identify misoriented polarized capacitors. Cap Xpress uses the Opens Xpress modified test fixture.

Orient Xpress This option generates tests that identify misoriented integrated circuits (ICs) that contain multiple asymmetric power and ground pins. Orient Xpress uses the Opens Xpress modified test fixture.

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GR228X Test Software

Panel Test, Split Fixturing, and Serial Numbering The Panel Test and Split Fixturing features enable you to speed up your production testing time. The Serial Numbering feature enables you to track a board through your production process. Refer to the GR228X Panel Test, Serial Numbering, and Split Fixturing Manual for more information about these features.

Panel Test The Panel Test software enables you to test a homogeneous panel of boards. Testing boards while still on the panel decreases the handling and throughput time. The Panel Test software supports: z Prepending and/or appending a user-specified prefix or suffix to each board in the panel. z Passing and failing data collection. z Fixture reports that encompass all boards on the panel.

Split Fixturing Split fixturing combines two smaller, identical, independent board test fixtures with a standard test fixturing casing. Using a split fixture enables you to increase board test throughput. The split fixture operates by alternating between the right-hand and left-hand side of the fixture when testing. This approach eliminates waiting for one test to complete before you setup and test another UUT. You can alternate between the right and left sides for testing the UUTs.

Serial Numbering In typical testing, serial numbers are used with some form of data collection. You can use serial numbering to electronically collect data and print the serial number on the repair ticket.

Test Analysis Tools The test analysis tools enable you to collect data during testing, then generate reports based on the information you select. The tools that enable you to analyze the collected data include: z Real time data collection z Data Display

Real Time Data Collection The GR228X system software can record test data and generate reports to help you analyze the tested component data. Analyzing the collected component data can assist in test development and manufacturing by producing reports that let you view board failure and pass ratios.

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Table 3–1 provides you with a brief description of the data logging options that are selected from the DIAGNOSE monitor page as shown in Figure 3–17. Each option produces a .log file with a varying degree of information. Table 3–1 Logging Options Logging Option

Description

Standard

Collects data for all components on the UUT. The amount of test data collected for the components determined by the Logging options. The Standard Logging combination of +PASSES option and LOG page PLOTS generation is commonly used as a debug tool and is sometimes used as acceptance criteria for Analog tests. The ALLFAULT command on the lower–level DIAGNOSE monitor page can also be used to characterize test program measurements and produce fault coverage reports. Refer to the GR228X Test Program Debug Manual.

Selective Data (SEL)

Enables you to select the components you want logged and the amount of data logged. Selective logging requires a Selective Options file (.sel) as input.

Real-Time Data Collection (RTDC)

Provides the most comprehensive data collection control. You can select sampling intervals. RTDC is commonly used in a real–time network environment as it allows for transfer of Log data at the end of each test run. RTDC requires a Data Collection Options file (.dco) as input.

Figure 3–17

DIAGNOSE Page

After you have run the test program many times and have collected data on the components tested in the program, you are ready to analyze the collected component data. The collected component data is placed into a formatted ASCII file with a .log extension during testing. The data that is stored in the .log file is not sorted or statistically processed.

3-32

GR228X Test Software

Summary Reports Summary reports are formatted ASCII files with a specific number of statistical entries. You use summary reports as input for further processing. The three summary report types generated by the .log report generator are: Report Type

Description

Statistics

Contains board–level data for analyzing the current data or summary file. It includes the: z Time period for which the report was generated z Number of failing, passing, and total boards tested z Total testing, waiting, and elapsed times z Average passing, failing, and actual board test times z Throughput per hour z Total faults and faults per failing board, if failure data was collected

Failure Data

Contains current failure data on a component level in addition to board–level statistics. The information includes the total number of failures and faults per failing board for each failing component. Also, you can generate a failure trend analysis in this mode if you specify the .LOG and .SUM files to be used in the comparison in the LOG = fields. Both current and summary failure data are reported, and any significant difference in failure rates for a component are flagged to bring attention to it.

Component Plots

Component plots generate a distribution of test measurements over a range on the component–level in addition to total number of failures and board–level statistics. The range is determined by the component test limits and measured values for all logged current data. No trend analysis is performed in this mode.

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Data Display Data Display (datad) extracts process performance statistics from the test system log file. It identifies trends or deficiencies in particular components by analyzing the failures that occur when you test a board. Collected data can also be graphed and plotted using the Data Display graphical software. You access data display from the Start menu or by clicking its icon from the GR228X Program Launcher. Analyzing test results with Data Display requires you to import the files you want to analyze, then choose the type of report you want to generate. Data Display offers these features: z Custom report generation z Multi–line color charts z 3–D bar charts z Run Chart z User–annotated charts z Hard copy reports Use Data Display to generate these reports and charts: z Tester Yield Report z Test Times Report z Passing Board Volume Report z Parts Overview Chart z Top Failing Parts Chart z Top Failing Components Chart z Measured Values Chart For detailed information about Data Display, refer to the GR228X Production Test User’s Guide.

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GR228X Test Software

OffĆline Programming GenRad offer these separately licensed software products that you can use on off-line programming stations. z ATG Xpress z TRACS III z GRXpert

ATG Xpress ATG Xpress is a separately licensed option that enables you to develop a test program off-line on a PC. For more information, refer to the ATG Xpress User’s Guide.

TRACS III TRACS III is a process information system designed to give you a clear and comprehensive picture of your manufacturing operation. TRACS III links all of your test processes together which enables you to determine what is actually occurring in your manufacturing processes. You can obtain reports on a wide range of data, such as defects and yields. For more information, refer to the TRACS III documentation.

GRXpert GRXpert is a software translation tool that converts HP3065/3070 or Schlumberger Technologies Series 30 in–circuit test programs to GenRad GR227X/228X language. The program is designed to facilitate the smooth transfer of previously debugged HP3065/3070 or Schlumberger Technologies (Factron/Fairchild) Series 30 test programs to GenRad’s GR227X/228X platforms. GRXpert translates HP in–circuit test program files (TESTPLAN), wirelist files (WIRELIST), digital executables (all digital ASCII source files under the BOARD digital directory) and their associated circuit description files (.BCF) to GenRad GR227X/228X circuit descriptions (.CKT) and test program (.TPG) files. GRXpert also translates Schlumberger Technologies in–circuit test program files (.BA), CHIPS digital test routines (.SR), and their associated circuit description files (.FX) to GenRad GR227X/228X Circuit Descriptions (.CKT) and Test Program (.TPG) files. For more information, refer to the GRXpert User’s Guide.

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Migrating from One Test System to Another At times you may want to move a test set to a different system model in the GR228X family. It is possible to use a GR228X test program and fixture that was developed for one type of GR228X Test System on a different type of GR228X Test System. The process of transferring the test program and fixture from one system type to another is called migration. In most cases, a test set developed on a GR227X Test System can be used on your GR228X Test System. These test sets can be transferred and modified as necessary. Table 3–2 identifies which GR228X test sets can be migrated to GR228X Test Systems. Table 3–2 Supported Migration to GR228X Testers GR228X Target Test System Source Tester

2280

2281

GR2270

Y


Y


Y

GR2271

Y




Y




Y



Y



Y



Y



Y



Y

Y



Y

Y

Y

Y

Y

Y

Y

Y

Y

Y

Y

Y

Y

Y

Y

N

N

Y

Y

N

Y





Y



GR2272 GR2275

Y

GR2276

Y

Y

GR2280 GR2281 GR2281A

N N

GR2282

GR2285

Y

Y

GR2283 GR2284



Y

Y N N





2281A 2282

Y Y



Y



2283

2284

2285

2286

Y

Y


Y


Y


Y

Y

Y




Y




Y




Y



Y



Y



Y Y

N Y



Y



Y



Y



Y

N

Y Y N



N



Y

Y Y Y

N



N



Y

Y Y Y

Y

Y Y Y

N

Y Y N



N



2287 2287L 2287A /LX Y Y Y Y

Y Y Y Y

N

N 

Y

Y

N











Y

N

Y

GR2287A

N

Y

Y

N

N











GR2288 GR2289

N

N

Y

Y

Y

Y 

N

N

N

N

Y Y



Y

Y Y



Y




Limited due to converter wiring and target test system pin count limitations.



Limited due to target test system pin count limitations.

N



N

Y

Y

Y

Y

Y

Y



Y

Y

Y

Y

N

Y

Y

Y

N

Y

Y

Y



N



Y

Y



N



Y

Y



N



Y

Y



N



Y



N



Y

Y

Y Y Y

Y

Y 

N

N



N

Y

Y

Y

Y

Y

N

Y

Y

Y

GR2287

N

Y



Y

Y

N

Y

N

Y

Y

Y

Y

Y

Y

Y

Y

Y

N

Y



Y

Y 

GR2287L, GR2287LX

Y

Y

Y



Y

Y

Y



228 9

Y

GR2286



228 8

Y



Y

Y



N

Y Y

N





Y



Y

Y



System tests analog components exclusively, it does not support digital component testing.



Requires a fixture converter that has 1-to-1 nail mapping. There is also a constraint on the number of source test

Y Y Y

N

program nails (1 -1152). 

Not supported because there is a greater multiplexing ratio.



Requires any SET TIMING statements be rewritten as SET CLOCK statements. Tests must have 5MHz capability.

For a detailed explanation on migrating a test set from one system to another, refer to the GR228X Migration User’s Guide.

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GR228X Test Software

Windows NT System Environment

4

This chapter provides a brief description of the Windows NT-based GR228X system environment tools which include: z Editing Tools z User Interfaces z Help Tools For more information on the Windows NT-based GR228X system environment, refer to the GR228X System Administration User’s Guide, or the non-GenRad documentation that shipped with the test system.

Editors The GR228X software is shipped with these text editors: z Programmer’s File Editor (PFE) z emacs z vim In addition, Window NT provides text editors such as Edit, Notepad, and WordPad. Refer to the Windows NT online help for more information about these editors. You can also install third-party text editors such as MicroSoft Word or EDT.

Introduction to GR228X Test Systems

4-1

PFE Editor The Programmer’s File Editor (PFE) is a 32–bit, large–capacity text file editor. Its capacity is limited only by the total amount of memory available on your system. There are no editor–imposed limits on the number of files that you can edit simultaneously, nor on the number of edit windows that you can have open. There is no limit on the size of file that can be handled, and no limit the number of lines that a file may contain. PFE adheres strictly to the Windows MDI conventions. Some of the feature of PFE enable you to: z Invoke most commands and facilities from menus z Navigate with a mouse or with keyboard shortcuts z Cut and paste from the clipboard z Reconfigure the use of keys z Run DOS commands, such as compilers, and to capture their output into windows for inspection z Define sets of templates that you can insert into the file you’re editing. z Group templates into distinct files and load them for use automatically. The documentation describing how to use PFE is available via online help topics. Click the Help menu for the available help options.

4-2

Windows NT System Environment

emacs emacs is a powerful text editor that is distributed through the Free Software Foundation, which develops GNU software. emacs contains many powerful features and it has been tailored to work well under the Windows environment. When you run emacs, a separate emacs window is created, complete with menus that permit you to enter emacs commands with the mouse. GenRad recommends that you become familiar with emacs and use it as your default editor because it is fast, powerful, works well in a Windows environment, and is available on a number of different operating systems. Refer to the GR228X Test Program Generation Manual for more information that can assist you in learning the emacs editor. In addition, refer to the online help for emacs.

vim vim is a display–oriented text editor that is available for Windows–NT. Expert vim users can make editing changes very quickly; however, beginners find vim difficult and hard to use. A brief list of common vim editing commands can be found in Appendix E. Also, more information about vim command line options, refer to the online help. There are two modes in vim: z Insert mode Insert mode enables you to add text to your file by typing at the keyboard. z Command mode Command mode enables you to enter vim commands using the keyboard. You are placed in command mode when you first enter vim. Refer to the GR228X Test Program Generation Manual for more information. In addition, refer to the online help for vim.

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4-3

Choosing a User Interface The GR228X Test Systems offer two user interfaces: TestFlo and the GR228X Monitor. You can use either TestFlo or the monitor as your default user interface when you are developing new test programs. You must use the GR228X monitor page interface when migrating a test program and fixture from one test system to another.

TestFlo Program Preparation Manager (PPM) The TestFlo user interface is an easy to use environment that helps you develop test programs without needing to know all the details of the individual files. TestFlo brings you through the test development process in the sequence necessary to generate an accurate and complete test set. It conveniently manages much of the complex test development process for you. Figure 4–1 shows TestFlo’s main window. NOTE

If you have a GR2281A, or GR2287A Test System, the default user interface is TestFlo.

You can use TestFlo for developing test programs for new PCBs as well as performing an ECO. You cannot use TestFlo to migrate to another GR228X Test System. Refer to the GR228X Test Program Generation Manual for a detailed explanation of the TestFlo Program Preparation Manager interface.

Figure 4–1

4-4

TestFlo PPM Main Window

Windows NT System Environment

GR228X Monitor The GR228X monitor user interface helps you to develop and debug test programs, perform production testing, and collect test results data. When using the monitor pages, you control every detail of the test development process. This amount of control is often desired by experienced users of GR228X Test Systems. You require complete control of the test system environment when performing ECOs or migrating to another GR228X Test System. NOTE

If you have a GR2280, GR2281, GR228X e-Series, GR228X i-Series,or a Windows NT PC Retrofitted Test System, the default user interface is the GR228X monitor.

The test development process for generating an accurate and complete test set is the same no matter which interface you choose. During the test development process, you will use several monitor pages. Figure 4–2 shows the DIAGNOSE Monitor page which is the default when you access the GR228X monitor page. The monitor utility pages are described in the GR228X System Administration User’s Guide. Most of the monitor pages are described with their corresponding function in the GR228X Test Program Generation Manual. Some monitor page descriptions are presented in the GR228X Documentation as they are used during the test development process.

Figure 4–2

Introduction to GR228X Test Systems

GR228X Monitor Page Interface

4-5

Online Help There are a variety of online help options available to you within the GR228X Test System Environment. The GR228X Test Systems contain these on-line help tools: z GR228X monitor page help z Online help topics z Online manuals

Monitor Page Help Monitor help is available for both command mode and screen–editing mode. In command mode, you can invoke monitor help by: Action

Description

Typing Help at command prompt

Displays monitor help. Press the space bar to page through monitor help. Press Return to quit help.

Clicking PF4 from VT100 keypad

Displays monitor help. Press the space bar to page through monitor help. Press Return to quit help.

Typing Help optionname at command prompt

Displays monitor help for the specified option. The help displays in the bottom three lines of the monitor page. To clear option help, click PF4 from the VT100 keypad.

In screen–editing mode, you can toggle the display of monitor option help for the selected option by clicking PF4 from the VT100 keypad. When option help is enabled, the option help changes when you move from one field to another.

Online Help Topics There are several levels of GR228X online help. You can access: z All of the help topics for the GR228X system To access all of the help topics for the GR228X system, click Start and point to Programs. Then, point to GenRad 228x and click GR228X Help. z Help topics for a particular application The help topics for a particular application, such as the Library Toolset or the Power Editor, are available from the applications Help menu by double-clicking the Help Topics option. z Context Sensitive Help For most applications, clicking the F1 key or a toolbar icon enables context sensitive help, which enables you to get specific help information for parts of the graphical user interface. In addition, some application Help menus provide access to specific help topics.

4-6

Windows NT System Environment

Figure 4–3 shows the help topics window for the GR228X online help. This window has three tabs: z Contents z Index z Find

Figure 4–3

Introduction to GR228X Test Systems

Help Topics Window

4-7

Contents Tab Figure 4–3 shows the help topics window with the Contents tab selected. This tab displays help topics organized by category. Double–clicking a book icon shows the help topics for that category. Double–clicking a document icon displays the help text for that topic. You can double–click an open book icon to close it. Figure 4–4 shows the organization within a typical category.

Figure 4–4

4-8

Help Topics Window with Contents Tab Selected

Windows NT System Environment

Index Tab Figure 4–5 shows the help topics window with the Index tab selected. This tab displays the help index. To find a topic you want, type its name in the search edit box. Or, you can scroll through the list of index entries. Click the entry you want, and then click Display to display the help text for the selected entry. Alternatively, you can double–click the entry to display its help text.

Figure 4–5

Help Topics Window with Index Tab Selected

Find Tab Selecting the Find tab enables you to search for specific words or phrases used in the help topics, instead of searching by category or index entry. Before using Find for the first time, you must create a database of the words used in all of the help topics. You have three choices for creating the database: z Minimize database size (recommended) z Maximize search capabilities z Custom search capabilities Be sure that you have sufficient disk space available for creating this database.

Introduction to GR228X Test Systems

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Online Manuals The GR228X software manuals are supplied in electronic format and are available from the GenRad 228X menu. With manuals in electronic format, you can navigate quickly through the documentation and locate specific information. The online manuals can be viewed using the Adobe Acrobat Reader 4.0. You can use Acrobat to view, navigate, and print documents, which are stored in Adobe Portable Document Format (PDF). Acrobat Reader 4.0 and the online manuals are provided and installed on your system, if you choose to install them, during the GR228X installation procedure. The online manuals are available from the Start menu, in the GenRad 228X menu. The Acrobat Reader allows you to perform full-text searches over the entire set of GR228X online manuals using the Search command. A master index of the GR228X online manuals is provided for this purpose. Also, Search provides a number of ways to limit or expand your search. For more information about using the Acrobat Reader, refer to Acrobat’s Reader Guide, which is accessible by click Help > Reader Guide.

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Windows NT System Environment

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Documentation Quick Reference

Use the tables in this chapter to quickly locate detailed information that will help you to understand and perform GR228X Test System tasks. Use the Table of Contents or Index of the document referenced to find the chapter or page where the task starts, or refer to the Master Index.

Hardware Documentation If you want information on ...

Refer to your system’s ...

System site requirements

Site Preparation Guide

System and peripheral installation procedures

Installation Manual

Preparation and wiring of a test fixture

Test Fixture Manual

System configuration and functional description, preventive maintenance, system verification program, and automatic calibration

Maintenance Manual

Servicing information, diagnostic procedures, removal and replacement, and calibration

Service Manual

System diagrams and related part lists

Diagrams and Parts List Manual

Introduction to GR228X Test Systems

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Software Documentation If you want information about...

Refer to the...

The process of preparing and developing a test set Debugging test programs

GR228X Test Program Generation Manual

Performing production tests

GR228X Production Test User’s Guide

How to write library routines

GR228X Test Library Programming Reference Manual GR228X Test Language Reference Manual

How to create a new test program or modify an existing test program, and GR228X language commands

GR228X Test Program Debug Manual

Device library models that currently exist

GR228X Device Library Reference Manual

Advanced applications and test methods

GR228X Advanced Applications Programming Guide GR228X System Administration User’s Guide

Managing the system and its user accounts, file transfers, backup, software installation, system error messages, and system startup/shutdown How to test panels of boards, how to use serial numbers, and how to use a split fixture Converting test program files, device libraries, and test fixtures from one type of system to another system

GR228X Panel Test, Serial Numbering, and Split Fixturing Manual GR228X Migration User’s Guide

Developing test programs for use with the guided probe which execute an arbitrary number of functional block tests (bursts) on functionally or topologically partitioned PCBs

Pinpoint Guided Probe User’s Guide

AFTM hardware and software

How to use Scan Pathfinder software

GR228X Analog Functional Test Module (AFTM) User’s Guide GR228X Deep Serial Memory (DSM) User’s Guide GR228X Scan Pathfinder User’s Guide

Testing for open pins without power or vectors

TEST XPRESS User’s Guide

Using Xpress Model to develop DTS models using regular and pseudo–random pattern techniques

Xpress Model User’s Guide

Hardware and software features for GR2285 and GR2289 10–MHz systems Software to generate digital test source (DTS) models that comply with the IEEE 1149.1 1990 standard

GR228X Xtended Performance Operation Manual BasicSCAN User’s Guide

How to use the Import CAD Data subflow within the TestFlo user interface. The various data importers that create a GenCAD file from CAD file(s).

Importing CAD Data Tutorial

DSM hardware and software

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CB/Test User’s Guide

Documentation Quick Reference

If you want information about...

Refer to the...

GR228X test system architecture, standard and optional hardware, and features of the test program developement software.

Introduction to GR228X Test Systems

The Multi-Protocol Instrument module, which provides functional test capabilities for a GR228X test sytem.

Multi-Protocol Instrument User’s Guide

The installation, setup, and use of the Frequency/Time Interval Instrument as well as the test language system subroutines that support it.

Frequency/Time Interval Instrument User’s Guide

The installation, setup, and use of the Vehicle Control Interface module as well as the test language system subroutines that support it

Vehicle Control Interface User’s Guide

Third Party Documentation If you want information on...

Refer to the...

The DEC PC

DECpc 400ST Series User’s Guide

Instructions for running and analyzing the QAPlus diagnostics

DIAGSOFT QAPlus Manual

Installation, operation, and preventive maintenance procedures for the Magnetec printer

GenRad Magnetec Model 960S Printer Manual

Installation and preventive maintenance procedures for the Microline printer

Okidata Microline 320/321 Printer Setup Guide

Installation, preventive maintenance procedures, and troubleshooting for the Seiko printer

Seiko DPU–5300 Line Thermal Printer User’s Guide

Setup, operation, and troubleshooting of Uninterruptable Power Supplies

Smart–UPS 600 Battery Backup/Uninterruptable Power Supply Owner’s Manual

Software for the Battery Backup/Uninterruptable Power Supply

PowerChute Plus for Windows NT Manual

Introduction to GR228X Test Systems

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